Non-destructive measurement of electron concentration in n-ZnSe by means of reflectance difference spectroscopy

1998 ◽  
Vol 184-185 ◽  
pp. 505-509 ◽  
Author(s):  
N. Kumagai ◽  
H.D. Jung ◽  
T. Hanada ◽  
Z. Zhu ◽  
T. Yasuda ◽  
...  
Keyword(s):  
Electron Concentration ◽  
Difference Spectroscopy ◽  
Reflectance Difference Spectroscopy ◽  
Destructive Measurement ◽  
Non Destructive

Non-Contact and Non-Destructive Measurement of Carrier Concentration of Nitrogen-Doped ZnSe by Reflectance Difference Spectroscopy

1997 ◽  
Vol 36 (Part 1, No. 11) ◽  
pp. 6638-6644 ◽  
Author(s):  
Cheng-Guo Jin ◽  
Tetsuji Yasuda ◽  
Kozo Kimura ◽  
Akihiro Ohtake ◽  
Li-Hsin Kuo ◽  
...  
Keyword(s):  
Carrier Concentration ◽  
Difference Spectroscopy ◽  
Nitrogen Doped ◽  
Reflectance Difference Spectroscopy ◽  
Destructive Measurement ◽  
Non Destructive

In situ reflectance difference spectroscopy of N-plasma doped ZnTe grown by molecular beam epitaxy

1998 ◽  
Vol 73 (26) ◽  
pp. 3857-3859 ◽  
Author(s):  
D. Stifter ◽  
M. Schmid ◽  
K. Hingerl ◽  
A. Bonanni ◽  
M. Garcia-Rocha ◽  
...  
Keyword(s):  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
Difference Spectroscopy ◽  
Reflectance Difference Spectroscopy
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