Far-field high-energy diffraction microscopy: a tool for intergranular orientation and strain analysis

2011 ◽  
Vol 46 (7) ◽  
pp. 527-547 ◽  
Author(s):  
J V Bernier ◽  
N R Barton ◽  
U Lienert ◽  
M P Miller
2018 ◽  
Vol 74 (5) ◽  
pp. 425-446 ◽  
Author(s):  
Ashley Nicole Bucsek ◽  
Darren Dale ◽  
Jun Young Peter Ko ◽  
Yuriy Chumlyakov ◽  
Aaron Paul Stebner

Modern X-ray diffraction techniques are now allowing researchers to collect long-desired experimental verification data sets that are in situ, three-dimensional, on the same length scales as critical microstructures, and using bulk samples. These techniques need to be adapted for advanced material systems that undergo combinations of phase transformation, twinning and plasticity. One particular challenge addressed in this article is direct analysis of martensite phases in far-field high-energy diffraction microscopy experiments. Specifically, an algorithmic forward model approach is presented to analyze phase transformation and twinning data sets of shape memory alloys. In the present implementation of the algorithm, the crystallographic theory of martensite (CTM) is used to predict possible martensite microstructures (i.e. martensite orientations, twin mode, habit plane, twin plane and twin phase fractions) that could form from the parent austenite structure. This approach is successfully demonstrated on three single- and near-single-crystal NiTi samples where the fundamental assumptions of the CTM are not upheld. That is, the samples have elastically strained lattices, inclusions, precipitates, subgrains, R-phase transformation and/or are not an infinite plate. The results indicate that the CTM still provides structural solutions that match the experiments. However, the widely accepted maximum work criterion for predicting which solution of the CTM should be preferred by the material does not work in these cases. Hence, a more accurate model that can simulate these additional structural complexities can be used within the algorithm in the future to improve its performance for non-ideal materials.


2016 ◽  
Vol 5 (1) ◽  
pp. 94-102 ◽  
Author(s):  
Todd J. Turner ◽  
Paul A. Shade ◽  
Joel V. Bernier ◽  
Shiu Fai Li ◽  
Jay C. Schuren ◽  
...  

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Jun-Sang Park ◽  
Hemant Sharma ◽  
Peter Kenesei

In the last two decades, far-field high-energy diffraction microscopy (FF-HEDM) and similar non-destructive techniques have been actively developed at synchrotron light sources around the world. As these techniques (and associated analysis tools) are becoming more available for the general users of these light sources, it is important and timely to characterize their performance and capabilities. In this work, the FF-HEDM instrument implemented at the 1-ID-E endstation of the Advanced Photon Source (APS) is summarized. The set of measurements conducted to characterize the instrument's repeatability and sensitivity to changes in grain orientation and position are also described. When an appropriate grain matching method is used, the FF-HEDM instrument's repeatability is approximately 5 µm in translation, 0.02° in rotation, and 2 × 10−4 in strain; the instrument sensitivity is approximately 5 µm in translation and 0.05° in rotation.


2018 ◽  
Vol 57 (13) ◽  
pp. 3488
Author(s):  
Jianwei Yu ◽  
Xiaoping Ouyang ◽  
Li Zhou ◽  
Youen Jiang ◽  
Baoqiang Zhu ◽  
...  

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