Self-correction method of out-of-plane motions in two-dimensional digital image correlation

Author(s):  
Wentao Yan ◽  
Feng Lin

Strain monitoring is very important in the manufacturing, assembling, installation and servicing processes in both mechanical and civil engineering fields. Two-dimensional digital image correlation is a simple, efficient strain monitoring method, but one major bottleneck is the unacceptable error due to the unavoidable out-of-plane motions of the object in practice. We propose a “self-correction” method: employing the originally extracted strain values in different directions to correct the errors due to out-of-plane motions. It is applicable to many engineering applications with known relationship of strains in different directions. A uniaxial tension test was conducted to demonstrate the effectiveness and practicality of this self-correction method. Compared with other correction methods, this method is not only simpler but also more efficient in correcting errors due to the lens distortion caused by self-heating. Both the experiment and theoretical analyses demonstrate that this self-correction method maintains the high accuracy of the digital image correlation method.

Author(s):  
Wei Chu ◽  
Joseph Fu ◽  
Theodore Vorburger

Digital image correlation (DIC) is a method for measuring the surface displacements and displacement gradients in materials under deformation. The method has also been applied to the calculation of image distortion for scanning probe microscopy (SPM). The traditional DIC method directly uses the intensity values of compared images but does not take out-of-plane nonlinearity error into account. However, in SPM measurements, the recorded z-direction value is a sum of the real surface height of the sample and any longitudinal deformation of the piezoelectric tube. In order to improve the calculation accuracy of the displacement fields, an improved DIC method is performed here. Two new parameters related to out-of-plane error are introduced in the mathematical modeling. The in-plane displacements between two compared images are then calculated pixel by pixel, with the z-direction error accounted for. This method is tested by applying it to two pairs of atomic force microscopy (AFM) images along the fast and slow scan directions.


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