Gradual reliability analysis of mechanical component systems

The actual structural systems have many failure modes. Due to the same random sources owned by the performance functions of these failure modes, there usually exist some nonlinear correlations between the various failure modes. How to handle the nonlinear correlations is one of the main scientific problems in the field of structural system reliability. In this paper, for the two-component systems and multiple-component systems with multiple failure modes, the mixed copula models for time-independent reliability analysis of series systems, parallel systems, series-parallel systems, and parallel-series systems are presented. These obtained mixed copula models, considering the nonlinear correlation between failure modes, are obtained with the chosen optimal copula functions with the Bayesian selection criteria and Monte Carlo Sampling (MCS) method. And a numerical example is provided to illustrate the feasibility and application of the built mixed models for structural system reliability.

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Reliability Analysis of Mechanical Component with Multiple Failure Modes

Transactions of the Korean Society of Mechanical Engineers A ◽

10.3795/ksme-a.2013.37.9.1169 ◽

2013 ◽

Vol 37 (9) ◽

pp. 1169-1174 ◽

Cited By ~ 1

Author(s):

Mu Seong Chang ◽

Byung Oh Choi ◽

Bo Sik Kang ◽

Jong Won Park ◽

Choong Sung Lee

Keyword(s):

Reliability Analysis ◽

Failure Modes ◽

Multiple Failure Modes ◽

Mechanical Component

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Role of boundaries in the crystallization of amorphous films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100105199 ◽

1988 ◽

Vol 46 ◽

pp. 626-627

Author(s):

D. A. Smith

Keyword(s):

Low Temperature ◽

Amorphous State ◽

Nucleation And Growth ◽

Amorphous Films ◽

Island Nucleation ◽

Surface Steps ◽

Transmission Electron ◽

Component Systems ◽

Temperature Deposition

The nucleation and growth processes which lead to the formation of a thin film are particularly amenable to investigation by transmission electron microscopy either in situ or subsequent to deposition. In situ studies have enabled the observation of island nucleation and growth, together with addition of atoms to surface steps. This paper is concerned with post-deposition crystallization of amorphous alloys. It will be argued that the processes occurring during low temperature deposition of one component systems are related but the evidence is mainly indirect. Amorphous films result when the deposition conditions such as low temperature or the presence of impurities (intentional or unintentional) preclude the atomic mobility necessary for crystallization. Representative examples of this behavior are CVD silicon grown below about 670°C, metalloids, such as antimony deposited at room temperature, binary alloys or compounds such as Cu-Ag or Cr O2, respectively. Elemental metals are not stable in the amorphous state.

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