Angle domain inversion imaging of relative impedance perturbation

Author(s):  
Yanan Liu ◽  
Shengchang Chen ◽  
Guoxin Chen
Keyword(s):  
2002 ◽  
Vol 14 (11) ◽  
pp. 1509-1511 ◽  
Author(s):  
N. Courjal ◽  
H. Porte ◽  
A. Martinez ◽  
J.-P. Goedgebuer

1994 ◽  
Vol 157 (1) ◽  
pp. 111-116 ◽  
Author(s):  
G. Rosenman ◽  
V. D. Kugel ◽  
N. Angert
Keyword(s):  

2018 ◽  
Vol 113 (25) ◽  
pp. 252901 ◽  
Author(s):  
Jörg Imbrock ◽  
Haissam Hanafi ◽  
Mousa Ayoub ◽  
Cornelia Denz

2002 ◽  
Vol 81 (4) ◽  
pp. 700-702 ◽  
Author(s):  
Yunlin Chen ◽  
Jingjun Xu ◽  
Yongfa Kong ◽  
Shaolin Chen ◽  
Guangyin Zhang ◽  
...  

MRS Bulletin ◽  
2001 ◽  
Vol 26 (12) ◽  
pp. 968-968 ◽  
Author(s):  
Iulia Muntele

1992 ◽  
Vol 60 (23) ◽  
pp. 2828-2830 ◽  
Author(s):  
Alan C. G. Nutt ◽  
Venkatraman Gopalan ◽  
Mool C. Gupta

1996 ◽  
Vol 29 (3) ◽  
pp. 279-284 ◽  
Author(s):  
Z. W. Hu ◽  
P. A. Thomas ◽  
J. Webjörn

Periodic domain inversion in an electric field poled LiNbO3 crystal has been studied using high-resolution multiple-crystal multiple-reflection X-ray diffraction topography. Fine linear contrast with spacings that correspond to the lateral dimensions of the periodic pattern has been observed by the choice of an appropriate diffraction mode to provide high spatial resolution and is shown to arise essentially from strains at the domain walls. The origin of the strain contrast at the domain walls is suggested primarily to be the result of the domain-inversion processing via the converse piezeoelectric effect. A structural model for the domain inversion that is based on a pseudosymmetry argument is invoked in order to quantify the ionic displacements for twinning. These results are compared with those obtained in a previous study employing a different diffraction mode [Hu, Thomas & Webjörn (1995). J. Phys. D, 28, A189–A194].


2020 ◽  
Author(s):  
M. Cavalca ◽  
R.P. Fletcher ◽  
M. Shadrina ◽  
C. Leone ◽  
L. Leon

2019 ◽  
Author(s):  
M. Shadrina ◽  
C. Leone ◽  
M. Cavalca ◽  
R. Fletcher ◽  
M. Gherasim
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document