Applications of X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry in Characterization of Polymer Blends

2019 ◽  
pp. 415-450
Author(s):  
Chi-Ming Chan ◽  
Jingshen Wu ◽  
Yiu-Wing Mai
Keyword(s):  
Mass Spectrometry ◽  
Polymer Blends ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Static time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films

2001 ◽  
Vol 31 (8) ◽  
pp. 724-733 ◽  
Author(s):  
Caren D. Tidwell ◽  
David G. Castner ◽  
Stephen L. Golledge ◽  
Buddy D. Ratner ◽  
Klaus Meyer ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Characterization of hydrogenated graphite powder by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

RSC Advances ◽  
2016 ◽  
Vol 6 (84) ◽  
pp. 80649-80654 ◽  
Author(s):  
Wenjing Xie ◽  
Kai Mo Ng ◽  
Lu-Tao Weng ◽  
Chi-Ming Chan
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Graphite Powder ◽  
X Ray ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Hydrogenated graphite powder was obtained through Birch reduction of graphite powder and characterized by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) at 500 °C.

Characterization of metal surfaces by secondary ion mass spectrometry x-ray photoelectron spectroscopy

1978 ◽  
Vol 50 (9) ◽  
pp. 1286-1290 ◽  
Author(s):  
R. W. Hewitt ◽  
A. T. Shepard ◽  
W. E. Baitinger ◽  
Nicholas. Winograd ◽  
G. L. Ott ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Metal Surfaces ◽  
Secondary Ion Mass Spectrometry ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Characterization of Composition C4 Explosives using Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy

2010 ◽  
Vol 82 (17) ◽  
pp. 7237-7248 ◽  
Author(s):  
Christine M. Mahoney ◽  
Albert J. Fahey ◽  
Kristen L. Steffens ◽  
Bruce A. Benner ◽  
Richard T. Lareau
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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