Low-Angle Elastic Light Scattering Study of Diffusion-Limited Aggregation

1988 ◽  
Vol 7 (7) ◽  
pp. 599-604 ◽  
Author(s):  
F Ferri ◽  
M Giglio ◽  
E Paganini ◽  
U Perini
1997 ◽  
Vol 7 (6) ◽  
pp. 913-929 ◽  
Author(s):  
Éric Freyssingeas ◽  
Didier Roux ◽  
Frédéric Nallet

1997 ◽  
Vol 45 (5) ◽  
pp. 1574-1578 ◽  
Author(s):  
Xin Qi Liu ◽  
Masami Yonekura ◽  
Masakazu Tsutsumi ◽  
Yoh Sano

1994 ◽  
Vol 375 ◽  
Author(s):  
C. Lavoie ◽  
B. Haveman ◽  
E. Nodwell ◽  
T. Pinnington ◽  
T. Tiedje ◽  
...  

AbstractIn-situ elastic light scattering is used to measure the evolution of the surface morphology of InxGa1−xAs films during molecular beam epitaxy growth on GaAs substrates. The in-situ measurements are compared with ex-situ measurements of the surface morphology on quenched films by optical scatterometry and atomic force microscopy (AFM). The AFM results are in good agreement with the rms roughness obtained from light scattering and both techniques detect the onset of misfit dislocation formation in this system.


Polymer ◽  
1991 ◽  
Vol 32 (17) ◽  
pp. 3211-3217 ◽  
Author(s):  
T Herning ◽  
M Djabourov ◽  
J Leblond ◽  
G Takerkart

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