2407 One-Dimensional Generalized Thermoelastic Analysis of a Thin Film with Damping : Solutions Obtained Using a Numerical Inverse Laplace Transform Method

2009 ◽  
Vol 2009.22 (0) ◽  
pp. 242-243
Author(s):  
Takashi FUJIKI ◽  
Fumihiro ASHIDA ◽  
Sei-ichiro SAKATA
Keyword(s):  
Thin Film ◽  
Laplace Transform ◽  
Inverse Laplace Transform ◽  
Laplace Transform Method ◽  
Transform Method ◽  
One Dimensional ◽  
Thermoelastic Analysis ◽  
Numerical Inverse Laplace Transform ◽  
Generalized Thermoelastic

Depth Profiling of Strain in Textured Tungsten Films

MRS Advances ◽  
2018 ◽  
Vol 3 (8-9) ◽  
pp. 411-417
Author(s):  
Gianguido Baldinozzi ◽  
Philippe Lecoeur ◽  
Vassilis Pontikis
Keyword(s):  
Laplace Transform ◽  
Depth Profiling ◽  
Inverse Laplace Transform ◽  
X Ray Diffraction ◽  
Laplace Transform Method ◽  
Transform Method ◽  
X Ray ◽  
Plasma Facing Component ◽  
The Status ◽  
Different Depths

ABSTRACTDevelopment of materials and engineering solutions in fusion technologies supports the use of high-Z elements as Plasma Facing Component to avoid tritium deposition with carbon. Tungsten is among the most promising candidates for these applications. Therefore, research in this area has gained increasing attention. It is then important to assess the structure and strain of thick W coatings as those parameters influence the adhesion on various substrates. This paper describes the status of investigations of strain in thick films of tungsten. Glancing incidence X-ray diffraction can be used to study W polycrystalline textured films, obtain information about their structure, and establish a depth profiling of residual strain. The actual strain at different depths within the coating can be extracted from the measured averaged strain using the inverse Laplace transform method applied to a set of measurements at different angles of the impinging X-ray beam. Results of measurements on films of different thicknesses are discussed.

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