G0310305 Analysis of piezoelectric materials and anisotropic materials subjected to arbitrary loads at the elliptical boundary

2014 ◽  
Vol 2014 (0) ◽  
pp. _G0310305--_G0310305-
Author(s):  
Toru SASAKI ◽  
Toshimi KONDO ◽  
Takeshi Tane
Keyword(s):  
Piezoelectric Materials ◽  
Anisotropic Materials ◽  
Elliptical Boundary

Anisotropic Elasticity

1996 ◽  
Author(s):  
T. T. C. Ting
Keyword(s):  
Composite Materials ◽  
Elastic Constants ◽  
Piezoelectric Materials ◽  
Anisotropic Materials ◽  
Anisotropic Elasticity ◽  
Stress Singularities ◽  
Comprehensive Survey ◽  
The Subject ◽  
Key Topics ◽  
First Time

Anisotropic Elasticity offers for the first time a comprehensive survey of the analysis of anisotropic materials that can have up to twenty-one elastic constants. Focusing on the mathematically elegant and technically powerful Stroh formalism as a means to understanding the subject, the author tackles a broad range of key topics, including antiplane deformations, Green's functions, stress singularities in composite materials, elliptic inclusions, cracks, thermo-elasticity, and piezoelectric materials, among many others. Well written, theoretically rigorous, and practically oriented, the book will be welcomed by students and researchers alike.

Stress Intensity Factor Analysis of an Interfacial Corner Between Piezoelectric Bimaterials in a Two Dimensional Structure Using the H-Integral Method

2011 ◽  
Author(s):  
Toru Ikeda ◽  
Hiroshi Hirai ◽  
Mitsutoshi Abe ◽  
Masatsugu Chiba ◽  
Noriyuki Miyazaki
Keyword(s):  
Stress Intensity ◽  
Stress Intensity Factors ◽  
Piezoelectric Materials ◽  
Dissimilar Materials ◽  
Anisotropic Materials ◽  
Stroh Formalism ◽  
Asymptotic Solutions ◽  
Dimensional Structure ◽  
Electronic Packages ◽  
Intensity Factors

A corner of bonded dissimilar materials is one of the main causes of the failure of electronic packages or MEMS structures. These materials are sometimes anisotropic materials and piezoelectric materials. To evaluate the integrity of a corner of bonded piezoelectric materials is useful for the reliability of electronic packages and MEMS. Asymptotic solutions around the interfacial corner between piezoelectric bimaterials can be obtained by the combination of the Stroh formalism and the Williams eigenfunction expansion method. Based on an extension of the Stroh formalism and the H-integral derived from Betti’s reciprocal principle for piezoelectric problems, we analyzed the stress intensity factors (SIFs) and asymptotic solutions of piezoelectric bimaterials. The eigenvalues and eigenvectors of an interfacial corner between dissimilar piezoelectric anisotropic materials are determined using the key matrix. The H-integral for piezoelectric problems is introduced to obtain the scalar coefficients, which are related to the SIFs. We propose a new definition of the SIFs of an interfacial corner for piezoelectric materials, and we demonstrated the accuracy of the SIFs by comparing the asymptotic solutions with the results obtained by the finite element method (FEM) with very fine meshes. Proposed method can analyze the stress intensity factors of a corner and a crack between dissimilar isotropic materials, anisotropic materials and anisotropic piezoelectric materials.

Analysis of Sputtered Zinc Oxide Films

1980 ◽  
Vol 38 ◽  
pp. 416-417
Author(s):  
T. A. Emma ◽  
M. P. Singh
Keyword(s):  
Electron Microscopy ◽  
Zinc Oxide ◽  
Piezoelectric Materials ◽  
Oxide Films ◽  
Optical Quality ◽  
Zno Films ◽  
Rf Power ◽  
X Ray Diffraction ◽  
Sputtered Films ◽  
Zinc Oxide Films

Optical quality zinc oxide films have been characterized using reflection electron diffraction (RED), replication electron microscopy (REM), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Significant microstructural differences were observed between rf sputtered films and planar magnetron rf sputtered films. Piezoelectric materials have been attractive for applications to integrated optics since they provide an active medium for signal processing. Among the desirable physical characteristics of sputtered ZnO films used for this and related applications are a highly preferred crystallographic texture and relatively smooth surfaces. It has been found that these characteristics are very sensitive to the type and condition of the substrate and to the several sputtering parameters: target, rf power, gas composition and substrate temperature.

Three-Dimensional Ultrasonic Crack Detection in Anisotropic Materials

1997 ◽  
Vol 9 (2) ◽  
pp. 59-79 ◽  
Author(s):  
J. Mattsson ◽  
A. J. Niklasson ◽  
A. Eriksson
Keyword(s):  
Crack Detection ◽  
Three Dimensional ◽  
Anisotropic Materials

Energy Harvesting Using Piezoelectric Materials on Microcantilevr Structure

2012 ◽  
Vol 2 (5) ◽  
pp. 252-255
Author(s):  
Rudresha K J Rudresha K J ◽  
◽  
Girisha G K Girisha G K
Keyword(s):  
Energy Harvesting ◽  
Piezoelectric Materials
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