Stress Intensity Factors Analyses of Three-Dimensional Interface Crack between Anisotropic Dissimilar Materials

2006 ◽  
Vol 72 (724) ◽  
pp. 1992-1999
Author(s):  
Masaki NAGAI ◽  
Toru IKEDA ◽  
Noriyuki MIYAZAKI
Author(s):  
Won-Keun Kim ◽  
Toru Ikeda ◽  
Noriyuki Miyazaki

Anisotropic Conductive Adhesive Film (ACF) has been used for electronic assemblies such as the connection between a Liquid Crystal Display (LCD) panel and a flexible print circuit board (FPC). ACF is expected to be a key technology for flip chip packaging and chip size packaging. The goal of our work is to provide an optimum design scheme to achieve the best combination of electrical performance and mechanical reliability for electronic packages using the ACF. This study presents an evaluation technology for the delamination of the ACF connections. We utilized the stress intensity factors of an interface crack between jointed dissimilar materials. The evaluation technology presented herein was found to provide reliability of an electronic package using the ACF connection during the solder reflow process.


1987 ◽  
Vol 54 (4) ◽  
pp. 828-832 ◽  
Author(s):  
J. W. Hutchinson ◽  
M. E. Mear ◽  
J. R. Rice

A crack paralleling a bonded plane interface between two dissimilar isotropic elastic solids is considered. When the distance of the crack from the interface is small compared to the crack length itself and to other length scales characterizing the geometry, a simple universal relation exists between the Mode I and Mode II stress intensity factors and the complex stress intensity factor associated with the corresponding problem for the crack lying on the interface. In other words, if the influence of external loading and geometry on the interface crack is known, then this information can immediately be used to generate the stress intensity factors for the sub-interface crack. Conditions for cracks to propagate near and parallel to, but not along, an interface are derived.


Sign in / Sign up

Export Citation Format

Share Document