Selection and Testing of High Current Contact Materials for Tokamak Devices

1983 ◽  
Vol 4 (2P2) ◽  
pp. 707-711
Author(s):  
Dennis C. Banker
2014 ◽  
Vol 47 (12) ◽  
pp. 125501 ◽  
Author(s):  
J Jaćimović ◽  
L Felberbaum ◽  
E Giannini ◽  
J Teyssier

Author(s):  
L. Hester ◽  
L. Compton ◽  
M. Young ◽  
D. Shores ◽  
D. Wise ◽  
...  
Keyword(s):  

2021 ◽  
Vol 21 (3) ◽  
pp. 38-42
Author(s):  
Dušan MEDVEĎ ◽  
◽  
Ján PRESADA ◽  

This paper deals with mathematical modelling of the temperature distribution in the vicinity of a direct electrical high-current contact under the action of a nominal current of 3000 A. High-current electrical contacts belong among the elements by which a large number of electrical devices are connected. They play an important role especially in the transmission and distribution system, where they have to withstand adverse weather conditions that have a significant impact on their degradation.


2007 ◽  
Vol E90-C (7) ◽  
pp. 1377-1384 ◽  
Author(s):  
E. WALCZUK ◽  
P. BORKOWSKI ◽  
K. FRYDMAN ◽  
D. WOJCIK-GRZYBEK ◽  
W. BUCHOLC ◽  
...  

2020 ◽  
Vol 48 (4) ◽  
pp. 1138-1145
Author(s):  
Chao Yan ◽  
Lijun Wang ◽  
Tuo Zhang ◽  
Jiahao Zhang ◽  
Kai Wang ◽  
...  

Author(s):  
R. Hutchings ◽  
I.P. Jones ◽  
M.H. Loretto ◽  
R.E. Smallman

There is increasing interest in X-ray microanalysis of thin specimens and the present paper attempts to define some of the factors which govern the spatial resolution of this type of microanalysis. One of these factors is the spreading of the electron probe as it is transmitted through the specimen. There will always be some beam-spreading with small electron probes, because of the inevitable beam divergence associated with small, high current probes; a lower limit to the spatial resolution is thus 2αst where 2αs is the beam divergence and t the specimen thickness.In addition there will of course be beam spreading caused by elastic and inelastic interaction between the electron beam and the specimen. The angle through which electrons are scattered by the various scattering processes can vary from zero to 180° and it is clearly a very complex calculation to determine the effective size of the beam as it propagates through the specimen.


Sign in / Sign up

Export Citation Format

Share Document