MCDET: A Probabilistic Dynamics Method Combining Monte Carlo Simulation with the Discrete Dynamic Event Tree Approach

2006 ◽  
Vol 153 (2) ◽  
pp. 137-156 ◽  
Author(s):  
Martina Kloos ◽  
Jörg Peschke
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Event Tree ◽  
Discrete Dynamic ◽  
Dynamic Event ◽  
Tree Approach ◽  
Dynamics Method

scholarly journals Nuclear Power Plant Cyber Security Discrete Dynamic Event Tree Analysis (LDRD 17-0958) FY17 Report

2017 ◽  
Author(s):  
Timothy A. Wheeler ◽  
Matthew R. Denman ◽  
R. A. Williams ◽  
Nevin Martin ◽  
Zachary Kyle Jankovsky
Keyword(s):  
Power Plant ◽  
Nuclear Power Plant ◽  
Cyber Security ◽  
Nuclear Power ◽  
Event Tree ◽  
Event Tree Analysis ◽  
Tree Analysis ◽  
Discrete Dynamic ◽  
Dynamic Event

scholarly journals RAVEN. Dynamic Event Tree Approach Level III Milestone

2014 ◽  
Author(s):  
Andrea Alfonsi ◽  
Cristian Rabiti ◽  
Diego Mandelli ◽  
Joshua Cogliati ◽  
Robert Kinoshita
Keyword(s):  
Event Tree ◽  
Dynamic Event ◽  
Tree Approach

scholarly journals RAVEN: Dynamic Event Tree Approach Level III Milestone

2013 ◽  
Author(s):  
Andrea Alfonsi ◽  
Cristian Rabiti ◽  
Diego Mandelli ◽  
Joshua Cogliati ◽  
Robert Kinoshita
Keyword(s):  
Event Tree ◽  
Dynamic Event ◽  
Tree Approach

scholarly journals Research on Time-Dependent Failure Modeling Method of Integrating Discrete Dynamic Event Tree With Fault Tree

2019 ◽  
Vol 7 ◽  
Author(s):  
Anqi Xu ◽  
Zhijian Zhang ◽  
Min Zhang ◽  
He Wang ◽  
Huazhi Zhang ◽  
...  
Keyword(s):  
Fault Tree ◽  
Modeling Method ◽  
Time Dependent ◽  
Event Tree ◽  
Discrete Dynamic ◽  
Dynamic Event ◽  
Failure Modeling ◽  
Dependent Failure

Electron Scattering in Solids

1990 ◽  
Vol 48 (2) ◽  
pp. 4-5
Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Elastic Scattering ◽  
Electron Scattering ◽  
Cross Sections ◽  
Expansion Method ◽  
Electron Excitation ◽  
Partial Wave Expansion ◽  
Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

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