Research on shot noise suppression in realistic nano-MOSFETs based on Monte Carlo simulation

2013 ◽  
Vol 43 (7) ◽  
pp. 866-873 ◽  
Author(s):  
XiaoFei JIA ◽  
Liang HE



2000 ◽  
Vol 53 (1) ◽  
pp. 3 ◽  
Author(s):  
L. Reggiani ◽  
A. Reklaitis ◽  
T. González ◽  
J. Mateos ◽  
D. Pardo ◽  
...  

We review recent theoretical investigations of shot-noise suppression in nondegenerate semiconductor structures surrounded by two contacts acting as thermal reservoirs. Calculations make use of an ensemble Monte Carlo simulator self-consistently coupled with a one-dimensional Poisson solver. By taking the doping of the injecting contacts and the applied voltage as variable parameters, the influence of elastic and inelastic scattering as well as of tunneling between heterostructures in the active region is investigated. In the case of a homogeneous structure at T = 300 K the transition from ballistic to diffusive transport regimes under different contact injecting statistics is analysed and discussed. Provided significant space-charge effects take place inside the active region, long-range Coulomb interaction is found to play an essential role in suppressing shot noise at applied voltages much higher than the thermal value. In the elastic diffusive regime, momentum space dimensionality is found to modify the suppression factor γ, which within numerical uncertainty takes values respectively of about ⅓, ½ and 0·7 in the 3D, 2D and 1D cases. In the inelastic diffusive regime, shot noise is suppressed to the thermal value. In the case of single and multiple barrier non-resonant heterostructures made by GaAs/AlGaAs at 77 K, the mechanism of suppression is identified in the carrier inhibition to come back to the emitter contact after having been reflected from a barrier. This condition is realised in the presence of strong inelastic scattering associated with emission of optical phonons. At increasing applied voltages for a two-barrier structure, shot noise is suppressed up to about a factor of 0·50 in close analogy with the corresponding resonant barrier-diode. For an increasing number of barriers, shot noise is found to be systematically suppressed to a more significant level by following approximately a 1/(N + 1) behaviour, N being the number of barriers. This mechanism of suppression is expected to conveniently improve the signal-to-noise ratio of these devices.



1997 ◽  
Vol 82 (6) ◽  
pp. 3161-3163 ◽  
Author(s):  
A. Reklaitis ◽  
L. Reggiani




2012 ◽  
Vol 11 (03) ◽  
pp. 1242006 ◽  
Author(s):  
VINCENT TALBO ◽  
DAMIEN QUERLIOZ ◽  
SYLVIE RETAILLEAU ◽  
PHILIPPE DOLLFUS

The 3D Monte Carlo simulation of an Si dot-based double-tunnel junction shows not only the possibility of shot noise suppression down to the Fano factor of 0.5, but also of super-Poissonian noise. The counting statistics of the tunneling events provides a clear interpretation of the different noise regimes according to the balance between the different tunneling rates involved.



1991 ◽  
Vol 05 (04) ◽  
pp. 315-322 ◽  
Author(s):  
L.Y. CHEN ◽  
G. LEVINE ◽  
J. YANG ◽  
C.S. TING

A stochastic process with repulsive correlations is proposed to simulate the nonequilibrium electronic transport through microstructures under finite bias voltage. Since an electron needs to stay a finite time τ0 on a channel state while traversing the constriction structure, electrons following within time τ0 cannot get through the same channel state because of the Pauli exclusion. This quantum effect induces a repulsive correlation and suppresses the shot noise. The Monte Carlo results are compared with experimental measurements.





2003 ◽  
Vol 19 (1-2) ◽  
pp. 107-111 ◽  
Author(s):  
L. Bonci ◽  
G. Fiori ◽  
M. Macucci ◽  
G. Iannaccone ◽  
S. Roddaro ◽  
...  


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