Highly stable, monochromatic and tunable optical radiation source and its application to high accuracy spectrophotometry

1992 ◽  
Vol 31 (4) ◽  
pp. 536 ◽  
Author(s):  
Valerie E. Anderson ◽  
Nigel P. Fox ◽  
David H. Nettleton
Keyword(s):  
Radiation Source ◽  
Optical Radiation ◽  
High Accuracy

Polychromatic optical radiation source for air tract monitoring system

2016 ◽  
Author(s):  
Ivan S. Nekrylov ◽  
Alexander N. Timofeev ◽  
Maksim A. Kleshchenok
Keyword(s):  
Monitoring System ◽  
Radiation Source ◽  
Optical Radiation

Design of a high accuracy temperature-controlling thermal radiation source for thermographic inspection

2002 ◽  
Author(s):  
XueJu Shen ◽  
Yuefeng Wang ◽  
Chu Zhang ◽  
Fu Wang ◽  
Wei Dong
Keyword(s):  
Thermal Radiation ◽  
Radiation Source ◽  
High Accuracy

Diffractometric crystal centering

1999 ◽  
Vol 32 (3) ◽  
pp. 510-515 ◽  
Author(s):  
Przemyslaw Dera ◽  
Andrzej Katrusiak
Keyword(s):  
High Pressure ◽  
Single Crystal ◽  
Crystal Lattice ◽  
Radiation Source ◽  
Prior Information ◽  
High Accuracy ◽  
Sample Position ◽  
Diamond Anvil ◽  
Significant Factors

A general formalism for centering a single-crystal on a four-circle diffractometer, based on the setting angles of reflections, is presented. The minimum information for the determination of crystal displacement are the diffractometer setting angles of two reciprocal vectors. The method is independent of the crystallographic system and does not require prior information about the crystal lattice. The size of the radiation source, beam divergence and homogeneity are shown to be significant factors for calculating the crystal displacement from the positions of the reflections. The method is primarily designed for samples enclosed in high-pressure diamond-anvil cells and other environments obscuring visual control of the sample position; however, high accuracy of the method in most cases allows the optical centering of the crystals to be improved, particularly for irregularly shaped samples. A procedure for retrieving true lattice dimensions, by accounting for the effect of the crystal displacement from the diffractometer center, is also presented.

scholarly journals Acceleration with self-injection for an all-optical radiation source at LNF

2013 ◽  
Vol 309 ◽  
pp. 202-209 ◽  
Author(s):  
L.A. Gizzi ◽  
M.P. Anania ◽  
G. Gatti ◽  
D. Giulietti ◽  
G. Grittani ◽  
...  
Keyword(s):  
Radiation Source ◽  
Optical Radiation ◽  
All Optical

scholarly journals Questions on utilization of different height balloon sources of optical radiation for calibration of network of ground microtelescopes for tracking of orbital satellites

2020 ◽  
Vol 4 (1) ◽  
pp. 14-19
Author(s):  
H. H. Asadov ◽  
U. F. Mamedova
Keyword(s):  
Optical Radiation ◽  
Spectral Characteristics ◽  
Calibration Procedure ◽  
High Accuracy ◽  
Laser Beams ◽  
Optimum Type ◽  
Laser Sources ◽  
Time Utilization ◽  
Stable Laser ◽  
Maximum Utilization

One of ways to increase accuracy of ground tracking of orbital satellites is high accuracy calibration of network of microtelescopes used for this purpose. To attain high accuracy utilization of stable laser sources of radiation is most expedient. To install such sources the balloon platforms mounted at some height are practiced. But utilization of only one fixed height of all sources for calibration could lead to insufficient value of signal/noise ratio due to unpredictable atmospheric events. At the same time utilization of sources with different spectral characteristics can complicate the required methodic for analysis. Authors suggest utilization of same type lasers and carrying out of calibration using platforms installed at different heights. Nonapparent function of dependence of laser beams divergence on height of balloon installation is considered for analysis. Some integrated limitation is imposed on this function. It is assumed that number of microtelescopes receiving optical radiation of one source linearly depends on height of the source. It is required to find out the optimum type of suggested non-apparent function upon which target functional composed as sum of all calibration signals could reach maximum. Utilization of such property of target functional for checking up of carried out calibration procedure is suggested. Providing for the required type of suggested non-apparent function is technically resolvable task because the beam divergence is controlled parameter and height of platform can be measured with sufficient accuracy.

scholarly journals OPTOELECTRONIC DEVICE FOR MEASURING THE POWER OF LASER RADIATION

2021 ◽  
Vol 3 ◽  
pp. 286-290
Author(s):  
Dimcho Pulov ◽  
Tsanko Karadzhov
Keyword(s):  
Signal Processing ◽  
Laser Radiation ◽  
Optical System ◽  
Radiation Source ◽  
Optical Radiation ◽  
Optoelectronic Device ◽  
Processing Unit ◽  
Electronic Signal Processing ◽  
Electronic Signal ◽  
Signal Processing Unit

A device for measuring the power of the laser radiation.has been designed. The device consists of transmitter and receiving part. The transmitter includes optical radiation source and optical system for collimation of radiation. The receiver part consists of silicon photodiodes, electronic signal processing unit   and  unit for measurements. 

A New 1,000 kV Electron Microscope

1967 ◽  
Vol 25 ◽  
pp. 260-261
Author(s):  
M. Nishigaki ◽  
S. Katagiri ◽  
H. Kimura ◽  
B. Tadano
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
Basic Research ◽  
Chromatic Aberration ◽  
High Accuracy ◽  
Biological Specimen ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron

The high voltage electron microscope has many advantageous features in comparison with the ordinary electron microscope. They are a higher penetrating efficiency of the electron, low chromatic aberration, high accuracy of the selected area diffraction and so on. Thus, the high voltage electron microscope becomes an indispensable instrument for the metallurgical, polymer and biological specimen studies. The application of the instrument involves today not only basic research but routine survey in the various fields. Particularly for the latter purpose, the performance, maintenance and reliability of the microscope should be same as those of commercial ones. The authors completed a 500 kV electron microscope in 1964 and a 1,000 kV one in 1966 taking these points into consideration. The construction of our 1,000 kV electron microscope is described below.

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