Advanced iterative algorithm for phase calibration of spatial light modulators integrated in optical instrumentation in a vibration environment

2020 ◽  
Vol 59 (22) ◽  
pp. 6760
Author(s):  
Manuel Silva-López ◽  
Néstor Uribe-Patarroyo ◽  
Alberto Álvarez-Herrero
2009 ◽  
Vol 11 (12) ◽  
pp. 125405 ◽  
Author(s):  
Ll Martínez-León ◽  
Z Jaroszewicz ◽  
A Kołodziejczyk ◽  
V Durán ◽  
E Tajahuerce ◽  
...  

2019 ◽  
Vol 9 (10) ◽  
pp. 2012 ◽  
Author(s):  
Rujia Li ◽  
Liangcai Cao

Phase-only Spatial Light Modulator (SLM) is one of the most widely used devices for phase modulation. It has been successfully applied in the field with requirements of precision phase modulation such as holographic display, optical tweezers, lithography, etc. However, due to the limitations in the manufacturing process, the grayscale-phase response could be different for every single SLM device, even varying on sections of an SLM panel. A diverse array of calibration methods have been proposed and could be sorted into two categories: the interferometric phase calibration methods and the diffractive phase calibration methods. The principles of phase-only SLM are introduced. The main phase calibration methods are discussed and reviewed. The advantages of these methods are analyzed and compared. The potential methods for different applications are suggested.


2016 ◽  
Vol 12 (10) ◽  
pp. 1027-1032 ◽  
Author(s):  
Omel Mendoza-Yero ◽  
Gladys Minguez-Vega ◽  
Lluis Martinez-Leon ◽  
Miguel Carbonell-Leal ◽  
Mercedes Fernandez-Alonso ◽  
...  

2016 ◽  
Vol 24 (13) ◽  
pp. 14159 ◽  
Author(s):  
José Luis Martínez Fuentes ◽  
Enrique J. Fernández ◽  
Pedro M. Prieto ◽  
Pablo Artal

2004 ◽  
Vol 43 (35) ◽  
pp. 6400 ◽  
Author(s):  
Xiaodong Xun ◽  
Robert W. Cohn

2017 ◽  
Vol 19 (12) ◽  
pp. 125701 ◽  
Author(s):  
Jianpei Xia ◽  
Chenliang Chang ◽  
Zhaozhong Chen ◽  
Zheyuan Zhu ◽  
Tingting Zeng ◽  
...  

1998 ◽  
Vol 536 ◽  
Author(s):  
A. B. Pevtsov ◽  
N. A. Feoktistov ◽  
V. G. Golubev

AbstractThin (<1000 Å) hydrogenated nanocrystalline silicon films are widely used in solar cells, light emitting diodes, and spatial light modulators. In this work the conductivity of doped and undoped amorphous-nanocrystalline silicon thin films is studied as a function of film thickness: a giant anisotropy of conductivity is established. The longitudinal conductivity decreases dramatically (by a factor of 109 − 1010) as the layer thickness is reduced from 1500 Å to 200 Å, while the transverse conductivity remains close to that of a doped a- Si:H. The data obtained are interpreted in terms of the percolation theory.


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