Simultaneous Measurement of Thickness and Refractive Index using Spectrum Multiplexing Digital Holographic Microscopy

Author(s):  
Jiwei Zhang ◽  
Chaojie Ma ◽  
Ying Li ◽  
Jianglei Di ◽  
Teli Xi ◽  
...  
2006 ◽  
Author(s):  
Florian Charrière ◽  
Tristan Colomb ◽  
Christian Depeursinge ◽  
Pierre Marquet ◽  
Etienne Cuche

2005 ◽  
Vol 13 (23) ◽  
pp. 9361 ◽  
Author(s):  
Benjamin Rappaz ◽  
Pierre Marquet ◽  
Etienne Cuche ◽  
Yves Emery ◽  
Christian Depeursinge ◽  
...  

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