Simultaneous Measurement of Thickness and Refractive Index using Spectrum Multiplexing Digital Holographic Microscopy
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2010 ◽
Vol 12
(11)
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pp. 115402
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2017 ◽
Vol 35
(16)
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pp. 3584-3590
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2009 ◽
Vol 20
(1)
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pp. 29-33
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