Phase Matched Three-Color Wave Mixing for the Determination of Refractive Index Dispersion

2013 ◽  
Author(s):  
Zhian Jin ◽  
Ivan Biaggio
Keyword(s):  
Refractive Index ◽  
Wave Mixing ◽  
Refractive Index Dispersion

Determination of thin film refractive index and thickness by means of film phase thickness

Open Physics ◽  
2008 ◽  
Vol 6 (2) ◽  
Author(s):  
Milen Nenkov ◽  
Tamara Pencheva
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Refractive Index ◽  
Barium Titanate ◽  
Spectral Region ◽  
Complex Refractive Index ◽  
Refractive Index Dispersion ◽  
New Approach ◽  
Phase Thickness

AbstractA new approach for determination of refractive index dispersion n(λ) (the real part of the complex refractive index) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate thin films are investigated in the spectral region 0.38–0.78 μm and their n(λ) and d are calculated. The approach is validated using Swanepoel’s method and it is found to be applicable for relatively thin films when measured transmittance spectra have one minimum and one maximum only.

Three-color nonlinear optical mixing for the determination of the refractive index dispersion of a tellurite glass

2010 ◽  
Vol 97 (13) ◽  
pp. 131104 ◽  
Author(s):  
Zhian Jin ◽  
Carolyn Kan ◽  
Urszula B. Szafruga ◽  
Jean Toulouse ◽  
Ivan Biaggio
Keyword(s):  
Refractive Index ◽  
Nonlinear Optical ◽  
Tellurite Glass ◽  
Refractive Index Dispersion ◽  
Optical Mixing

scholarly journals An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

2021 ◽  
Vol 21 (2) ◽  
pp. 61-66
Author(s):  
Erhan Tiryaki ◽  
Özlem Kocahan ◽  
Serhat Özder
Keyword(s):  
Refractive Index ◽  
Wavelet Transform ◽  
Continuous Wavelet Transform ◽  
Reflectance Spectrum ◽  
Dielectric Film ◽  
Dielectric Films ◽  
Continuous Wavelet ◽  
Improved Method ◽  
Refractive Index Dispersion

Abstract The Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically generated reflectance spectrum in the range of 300-1200 nm wavelength was analyzed by the Continuous Wavelet Transform (CWT) and the refractive index dispersion was obtained by the mentioned method. In addition, a noisy reflectance spectrum was analyzed to show the advantages of the CWT method. Refractive index dispersions calculated by the Morlet and the Paul wavelet were compared to GMW at the end of the study.

scholarly journals Determination of continuous complex refractive index dispersion of biotissue based on internal reflection

2016 ◽  
Vol 21 (1) ◽  
pp. 015003 ◽  
Author(s):  
Zhichao Deng ◽  
Jin Wang ◽  
Qing Ye ◽  
Tengqian Sun ◽  
Wenyuan Zhou ◽  
...  
Keyword(s):  
Refractive Index ◽  
Complex Refractive Index ◽  
Internal Reflection ◽  
Refractive Index Dispersion ◽  
Continuous Complex
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