Improvement of sensitivity in the analysis of vibrational properties of thin films by use of in situ ellipsometry:applications to hydrogenated amorphous carbon films

1999 ◽  
Vol 16 (7) ◽  
pp. 1044
Author(s):  
Thibaut Heitz ◽  
Bernard Drévillon ◽  
Christian Godet
2008 ◽  
Vol 47 (4) ◽  
pp. 2200-2204 ◽  
Author(s):  
Ya-Hsin Yang ◽  
Kuen Yi Wu ◽  
Chin-Yang Lee ◽  
Ming Yu Chen ◽  
Jennchang Hwang ◽  
...  

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