infrared ellipsometry Recently Published Documents

Author(s):

Aaron M. Katzenmeyer ◽

Ting S. Luk ◽

Ezra Bussmann ◽

Steve Young ◽

Evan M. Anderson ◽

...

Keyword(s):

Mid Infrared ◽

Infrared Ellipsometry ◽

Delta Doping ◽

Image Position

Abstract

Temperature-dependent infrared ellipsometry of Mo-doped VO2 thin films across the insulator to metal transition

Scientific Reports ◽

10.1038/s41598-020-65279-4 ◽

2020 ◽

Vol 10 (1) ◽

Author(s):

S. Amador-Alvarado ◽

J. M. Flores-Camacho ◽

A. Solís-Zamudio ◽

R. Castro-García ◽

J. S. Pérez-Huerta ◽

...

Keyword(s):

Thin Films ◽

Temperature Dependent ◽

Infrared Ellipsometry ◽

Vo2 Thin Films

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

Brilliant mid-infrared ellipsometry and polarimetry of thin films: Toward laboratory applications with laser based techniques

10.1116/1.5122869 ◽

2019 ◽

Vol 37 (6) ◽

pp. 060801 ◽

Author(s):

Karsten Hinrichs ◽

Timur Shaykhutdinov ◽

Christoph Kratz ◽

Andreas Furchner

Keyword(s):

Thin Films ◽

Mid Infrared ◽

Infrared Ellipsometry ◽

Ellipsometry And Polarimetry

Determination of the layered structure of baryta based heritage photographs by infrared ellipsometry

Journal of Cultural Heritage ◽

10.1016/j.culher.2018.09.009 ◽

2019 ◽

Vol 36 ◽

pp. 174-182

Author(s):

J.M. Flores-Camacho ◽

A. Nieto-Villena ◽

J.R. Martínez ◽

J.A. de la Cruz-Mendoza ◽

G. Ortega-Zarzosa ◽

...

Keyword(s):

Layered Structure ◽

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

Drude and Kukharskii mobility of doped semiconductors extracted from Fourier-transform infrared ellipsometry spectra

10.1116/1.5081055 ◽

2019 ◽

Vol 37 (1) ◽

pp. 012904 ◽

Cited By ~ 4

Author(s):

Stefan Zollner ◽

Pablo P. Paradis ◽

Farzin Abadizaman ◽

Nuwanjula S. Samarasingha

Keyword(s):

Fourier Transform ◽

Fourier Transform Infrared ◽

Doped Semiconductors ◽

The direct bandgap of gray α-tin investigated by infrared ellipsometry

Applied Physics Letters ◽

10.1063/1.5053884 ◽

2018 ◽

Vol 113 (23) ◽

pp. 232104 ◽

Cited By ~ 3

Author(s):

Rigo A. Carrasco ◽

Cesy M. Zamarripa ◽

Stefan Zollner ◽

José Menéndez ◽

Stephanie A. Chastang ◽

...

Keyword(s):

Direct Bandgap ◽

Infrared Ellipsometry Analysis of Heritage Photographic Prints

Studies in Conservation ◽

10.1080/00393630.2018.1476962 ◽

2018 ◽

Vol 63 (8) ◽

pp. 466-476 ◽

Author(s):

A. Nieto-Villena ◽

J. R. Martínez ◽

J. M. Flores-Camacho ◽

A. Lastras-Martínez ◽

J. A. de la Cruz-Mendoza ◽

...

Keyword(s):

Ellipsometry of Functional Organic Surfaces and Films - Springer Series in Surface Sciences ◽

Structure and Interactions of Polymer Thin Films from Infrared Ellipsometry

10.1007/978-3-319-75895-4_7 ◽

2018 ◽

pp. 145-171 ◽

Author(s):

Andreas Furchner

Keyword(s):

Thin Films ◽

Polymer Thin Films ◽

Mid-infrared ellipsometry, Raman and X-ray diffraction studies of Al Ga1−N/AlN/Si structures

Applied Surface Science ◽

10.1016/j.apsusc.2017.02.056 ◽

2017 ◽

Vol 421 ◽

pp. 859-865 ◽

Author(s):

Chennan Wang ◽

Ondřej Caha ◽

Filip Münz ◽

Petr Kostelník ◽

Tomáš Novák ◽

...

Keyword(s):

X Ray Diffraction ◽

Mid Infrared ◽

X Ray ◽

Infrared ellipsometry study of photogenerated charge carriers at the (001) and (110) surfaces of SrTiO3 crystals and at the interface of the corresponding LaAlO3/SrTiO3 heterostructures

Physical Review B ◽

10.1103/physrevb.95.195107 ◽

2017 ◽

Vol 95 (19) ◽

Cited By ~ 7

Author(s):

M. Yazdi-Rizi ◽

P. Marsik ◽

B. P. P. Mallett ◽

K. Sen ◽

A. Cerreta ◽

...

Keyword(s):

Charge Carriers ◽