scholarly journals Snapshot channeled imaging spectrometer using geometric phase holograms

2019 ◽  
Vol 27 (11) ◽  
pp. 15444
Author(s):  
Yifan Wang ◽  
Michael J. Escuti ◽  
Michael W. Kudenov
Keyword(s):  
Geometric Phase ◽  
Imaging Spectrometer ◽  
Phase Holograms

scholarly journals Fabrication of ideal geometric-phase holograms with arbitrary wavefronts

Optica ◽  
2015 ◽  
Vol 2 (11) ◽  
pp. 958 ◽  
Author(s):  
Jihwan Kim ◽  
Yanming Li ◽  
Matthew N. Miskiewicz ◽  
Chulwoo Oh ◽  
Michael W. Kudenov ◽  
...  
Keyword(s):  
Geometric Phase ◽  
Phase Holograms

scholarly journals Far-field and Fresnel Liquid Crystal Geometric Phase Holograms via Direct-Write Photo-Alignment

Crystals ◽  
2017 ◽  
Vol 7 (12) ◽  
pp. 383 ◽  
Author(s):  
Xiao Xiang ◽  
Jihwan Kim ◽  
Michael Escuti
Keyword(s):  
Liquid Crystal ◽  
Geometric Phase ◽  
Far Field ◽  
Direct Write ◽  
Photo Alignment ◽  
Phase Holograms

Controlling Light with Geometric-Phase Holograms

2016 ◽  
Vol 27 (2) ◽  
pp. 22 ◽  
Author(s):  
Michael J. Escuti ◽  
Jihwan Kim ◽  
Michael W. Kudenov
Keyword(s):  
Geometric Phase ◽  
Phase Holograms

Geometric Phase Holograms Imprinted by Femtosecond Laser Nanostructuring

2016 ◽  
Author(s):  
Rokas Drevinskas ◽  
Martynas Beresna ◽  
Jingyu Zhang ◽  
Aabid Patel ◽  
Aušra Čerkauskaitė ◽  
...  
Keyword(s):  
Femtosecond Laser ◽  
Geometric Phase ◽  
Phase Holograms

Local Lattice Strain Measurement Using Geometric Phase Analysis of Dark Field Images from Scanning Transmission Electron Microscopy

2011 ◽  
Author(s):  
Jayhoon Chung ◽  
Guoda Lian ◽  
Lew Rabenberg
Keyword(s):  
Phase Analysis ◽  
Geometric Phase ◽  
Process Development ◽  
Local Strain ◽  
Strain Engineering ◽  
Dark Field ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Geometric Phase Analysis ◽  
Scanning Transmission

Abstract Since strain engineering plays a key role in semiconductor technology development, a reliable and reproducible technique to measure local strain in devices is necessary for process development and failure analysis. In this paper, geometric phase analysis of high angle annular dark field - scanning transmission electron microscope images is presented as an effective technique to measure local strains in the current node of Si based transistors.

Corrective method for spectral offset error caused by radial distortion in the large aperture static imaging spectrometer

2020 ◽  
Vol 13 (6) ◽  
pp. 1-8
Author(s):  
AN Ling-ping ◽  
◽  
WANG Shuang ◽  
ZHANG Geng ◽  
LI Juan ◽  
...  
Keyword(s):  
Imaging Spectrometer ◽  
Radial Distortion ◽  
Large Aperture ◽  
Corrective Method ◽  
Offset Error ◽  
Static Imaging
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