Electro-Optic Modulation of Higher-Order Poincaré Beam Based on Nonlinear Optical Crystal

Vector beams (VBs) have spatially inhomogeneous polarization states distribution and have been widely used in many fields. In this paper, we proposed a method to modulate polarization states of higher-order Poincaré (HOP) beams and designed a system based on Mach-Zehnder interferometers, in which polarization state (include azimuth and ellipticity) of generated HOP beams were modulated by linear electro-optic (EO) effect of nonlinear optical crystals. Using this method, the polarization state of generated HOP beams could be controlled by voltage signal applied on EO crystals, which makes the process of the polarization state change with no optical element moving and mechanical vibrations. Besides, due to the flexibility of the voltage signal, the polarization state could be switched directly and immediately.

Analysis of the polarization states of light through the experimental determination of the Stokes Parameters

Atualmente, fontes de luz polarizada encontram diversas aplicações em dispositivos optoeletrônicos, “displays”, em testes de tensões em peças mecânicas e até em estudos de mineralogia. Uma das principais necessidades é determinar o estado de polarização (linear, circular, elíptico, ou uma sobreposição destes) do feixe luminoso. Para este fim, aplicamos neste trabalho a técnica de Elipsometria de Emissão para investigar os estados de polarização de diferentes fontes de luz. Esta técnica está baseada na teoria de Stokes e os tipos de polarização estão correlacionados aos parâmetros de Stokes. Realizamos medidas em feixes de luz proveniente de um LASER polarizado, um LASER polarizado passando por um defasador quarto de onda a ± 45° (polarização circular), um LED despolarizado e, esse mesmo LED, com sua luz refletida sobre uma placa de vidro em diversos ângulos e inclusive no ângulo de Brewster. A montagem experimental é composta de um defasador quarto de onda, um polarizador linear e um detector de luz. Os resultados obtidos apresentaram um desvio de aproximadamente 1% em relação à polarização conhecida das fontes de luz. Desta maneira, foi possível constatar que a técnica de Elipsometria de Emissão pode ser aplicada para se determinar a polarização da luz proveniente de fontes luminosas em geral.

Conditions for establishing the “generalized Snell’s law of refraction” in all-dielectric metasurfaces: theoretical bases for design of high-efficiency beam deflection metasurfaces

The generalized Snell’s law dictates that introducing a phase gradient at the interface of two media can shape incident light and achieve anomalous reflection or refraction. However, when the introduced phase gradient is realized via the scattering of nanoparticles in the metasurfaces, this law needs to be modified; certain conditions need to be met when the law is established. We present the conditions for establishing the “generalized Snell’s law of refraction” in all-dielectric metasurfaces under the incidence of different polarized light. These conditions can provide theoretical bases for the subsequent design of high-efficiency beam deflection metasurfaces. The relationship between the highest achievable anomalous refraction efficiency and the number of nanoparticles within one period of the metasurface is also summarized. In addition, the generalized refraction should not depend on the polarization states of incident light; however, the previous realization conditions of anomalous refraction were sensitive to the polarization states. Thus, conditions for establishing the polarization-independent generalized Snell’s law of refraction in all-dielectric metasurfaces are presented.

Mueller Matrix Polarimetry with Invariant Polarization Pattern Beams

A wide class of nonuniformly totally polarized beams that preserve their transverse polarization pattern during paraxial propagation was studied. Beams of this type are of interest, in particular, in polarimetric techniques that use a single input beam for the determination of the Mueller matrix of a homogeneous sample. In these cases, in fact, it is possible to test the sample response to several polarization states at once. The propagation invariance of the transverse polarization pattern is an interesting feature for beams used in these techniques, because the polarization state of the output beam can be detected at any transverse plane after the sample, without the use of any imaging/magnifying optical system. Furthermore, exploiting the great variety of the beams of this class, the ones that better fit specific experimental constrains can be chosen. In particular, the class also includes beams that present all possible polarization states across their transverse section (the full Poincaré beams (FPB)). The use of the latter has recently been proposed to increase the accuracy of the recovered Mueller matrix elements. Examples of FPBs with propagation-invariant polarization profiles and its use in polarimetry are discussed in detail. The requirement of invariance of the polarization pattern can be limited to the propagation in the far field. In such a case, less restrictive conditions are derived, and a wider class of beams is found.

Polarization Label-Free Microscopy Imaging of Biological Samples by Exploiting the Zeeman Laser Emission

Mueller Matrix Microscopy exploits the generation and the analysis of polarized light to create label-free contrast in biological images. However, when dealing with Optical Scanning Microscopy, it is required a fast generation of the polarization states in order to obtain a good Signal-to-Noise Ratio at the pixel-dwell time rate. In this work, we propose a microscopy system based on a scanning beam architecture that is exploiting the simultaneous emission of orthogonal polarization states from a Zeeman laser to provide Mueller Matrix images. This approach is based on the detection of an interference signal that allows to time-encode polarization states directly from the laser source, without the need for further active components for the management of the polarization states. We provide the theoretical model behind this approach and we apply our new method to the imaging of biological samples. Our Mueller Matrix imaging setup enables high-speed scanning microscopy, while preserving compactness and simplicity of construction. Our findings may lead to more effective dissemination of label-free techniques and their use by biological researchers.