Terahertz Optics: Terahertz Pulse Shaping in Time Domain Via Optical Rectification in Poled Lithium Niobate Crystals

2003 ◽  
Vol 14 (12) ◽  
pp. 42
Author(s):  
Yun-Shik Lee ◽  
Naaman Amer ◽  
Walter C. Hurlbut
2021 ◽  
Vol 29 (6) ◽  
pp. 9624
Author(s):  
Qili Tian ◽  
Hanxun Xu ◽  
Yi Wang ◽  
Yifan Liang ◽  
Yuemei Tan ◽  
...  

2003 ◽  
Vol 82 (2) ◽  
pp. 170-172 ◽  
Author(s):  
Y.-S. Lee ◽  
N. Amer ◽  
W. C. Hurlbut

2002 ◽  
Vol 41 (Part 1, No. 11B) ◽  
pp. 7033-7037 ◽  
Author(s):  
Seiji Kojima ◽  
Naoki Tsumura ◽  
Hideaki Kitahara ◽  
Mitsuo Wada Takeda ◽  
Seizi Nishizawa

2008 ◽  
Vol 94 (4) ◽  
pp. 623-628 ◽  
Author(s):  
D. Li ◽  
G. Ma ◽  
J. Ge ◽  
S. Hu ◽  
N. Dai

2014 ◽  
Vol 62 (18) ◽  
pp. 1486-1493 ◽  
Author(s):  
W. Ronny Huang ◽  
Shu-Wei Huang ◽  
Eduardo Granados ◽  
Koustuban Ravi ◽  
Kyung-Han Hong ◽  
...  

Author(s):  
Lihong Cao ◽  
Manasa Venkata ◽  
Meng Yeow Tay ◽  
Wen Qiu ◽  
J. Alton ◽  
...  

Abstract Electro-optical terahertz pulse reflectometry (EOTPR) was introduced last year to isolate faults in advanced IC packages. The EOTPR system provides 10μm accuracy that can be used to non-destructively localize a package-level failure. In this paper, an EOTPR system is used for non-destructive fault isolation and identification for both 2D and 2.5D with TSV structure of flip-chip packages. The experimental results demonstrate higher accuracy of the EOTPR system in determining the distance to defect compared to the traditional time-domain reflectometry (TDR) systems.


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