Studies on the Instrumental Factors Determining Errors in the Measurements of Raman Band Profiles. Part I: Optical Factors—A Comparison of Three Different Methods

1993 ◽  
Vol 47 (8) ◽  
pp. 1227-1233 ◽  
Author(s):  
L. Mariani ◽  
A. Morresi ◽  
M. G. Giorgini ◽  
G. Paliani ◽  
R. S. Cataliotti

A treatment is proposed which takes into account the following error sources in Raman band shape measurements: incident beam polarization, polarization analyzer misorientation, monochromator response, and observation over a finite solid angle. Three methods generally adopted for this type of measurements are compared in terms of the amount of spurious anisotropic component which enters the isotropic profile. The pertinence zones of each method are shown. The percentage of error is expressed by well-defined quantities entering analytical equations; this allows the experimentalist to choose the more suitable method on the basis of the experimental setup.

Author(s):  
N. J. Zaluzec

The ultimate sensitivity of microchemical analysis using x-ray emission rests in selecting those experimental conditions which will maximize the measured peak-to-background (P/B) ratio. This paper presents the results of calculations aimed at determining the influence of incident beam energy, detector/specimen geometry and specimen composition on the P/B ratio for ideally thin samples (i.e., the effects of scattering and absorption are considered negligible). As such it is assumed that the complications resulting from system peaks, bremsstrahlung fluorescence, electron tails and specimen contamination have been eliminated and that one needs only to consider the physics of the generation/emission process.The number of characteristic x-ray photons (Ip) emitted from a thin foil of thickness dt into the solid angle dΩ is given by the well-known equation


1996 ◽  
Vol 378 (2) ◽  
pp. 111-119 ◽  
Author(s):  
Elizabeth P.G. Arêas ◽  
Mauro C.C. Ribeiro ◽  
Paulo S. Santos

2020 ◽  
Vol 53 (6) ◽  
pp. 1559-1561
Author(s):  
Robert B. Von Dreele ◽  
Wenqian Xu

An estimate of synchrotron hard X-ray incident beam polarization is obtained by partial two-dimensional image masking followed by integration. With the correct polarization applied to each pixel in the image, the resulting one-dimensional pattern shows no discontinuities arising from the application of the mask. Minimization of the difference between the sums of the masked and unmasked powder patterns allows estimation of the polarization to ±0.001.


1986 ◽  
Vol 128 (5-6) ◽  
pp. 555-558 ◽  
Author(s):  
Masao Takayanagi ◽  
Hiro-o Hamaguchi ◽  
Mitsuo Tasumi

1996 ◽  
Vol 378 (2) ◽  
pp. 111-119 ◽  
Author(s):  
Elizabeth P.G. Arêas ◽  
Mauro C.C. Ribeiro ◽  
Paulo S. Santos

2003 ◽  
Vol 119 (16) ◽  
pp. 8567-8576 ◽  
Author(s):  
Ary O. Cavalcante ◽  
Mauro C. C. Ribeiro

Physica B+C ◽  
1986 ◽  
Vol 138 (3) ◽  
pp. 280-286 ◽  
Author(s):  
J.A. Janik ◽  
J.M. Janik ◽  
A. Migdał-Mikuli ◽  
E. Mikuli ◽  
K. Otnes

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