Thermoelectromotive Force

2016 ◽  
Author(s):  
Masahide Terazima ◽  
Noboru Hirota ◽  
Silvia E. Braslavsky ◽  
Andreas Mandelis ◽  
Stephen E. Bialkowski ◽  
...  
1934 ◽  
Vol 11 (4) ◽  
pp. 116-118
Author(s):  
N R Campbell ◽  
O Kantorowicz

2009 ◽  
Vol 77 (8) ◽  
pp. 639-641 ◽  
Author(s):  
Tsubasa MIGITA ◽  
Naoki TACHIKAWA ◽  
Yasushi KATAYAMA ◽  
Takashi MIURA

1922 ◽  
Vol 20 (5) ◽  
pp. 441-451 ◽  
Author(s):  
Skezug Kimura ◽  
Zunehachi Isawa

2011 ◽  
Vol 421 ◽  
pp. 107-109
Author(s):  
Yu Zhao ◽  
Yan Yan Zhu

In semiconductor industry, carrier concentration of a semiconductor material needs to be measured. Theoretical computation is complex and has its limitation. Experiment measurement always needs complicated and expensive instruments. Here, a new method for measuring the carrier concentration of Si was put forward. The dependence of thermoelectromotive force on temperature was graphed. The results showed that when temperature is below 460K, thermoelectromotive force is proportional to temperature of the hot probe. Compared with other similar methods, this method is more simplified and thet equipment is cheaper.


2012 ◽  
Vol 239-240 ◽  
pp. 726-729
Author(s):  
Qiao Liang Wang ◽  
Yu Zhao ◽  
Rui Feng Lv ◽  
Yan Yan Zhu

In semiconductor industry, carrier concentration of a semiconductor material needs to be measured. Theoretical computation is complex and has its limitation. Experiment measurement always needs complicated and expensive instruments. Here, a new method for measuring the carrier concentration of silicon wafer was put forward. The dependen curve of thermoelectromotive force on temperature was graphed. The results showed that when temperature is below 460K, thermoelectromotive force is proportional to temperature of the hot probe. With the help of Origin software, slope of curve was obtained.Accoeding to related formula,the doping concentartion and it’s uniformity were figured out finally .Compared with other similar methods, this method is more simplified and thet equipment is cheaper.


Cryogenics ◽  
2003 ◽  
Vol 43 (10-11) ◽  
pp. 571-574
Author(s):  
Michitaka Ono ◽  
Toru Kuriyama ◽  
Junji Ueda ◽  
Tetsuji Okamura

1995 ◽  
Vol 410 ◽  
Author(s):  
E. Maed A ◽  
M. Komatsu

ABSTRACTThermoelectric properties (Thermoelectromotive force and electrical conductivity) of porous silicon carbide ceramics are evaluated. Porous silicon carbide ceramics are made from rice hull by reacting silica and carbon, both of which are included in rice hull, using hotpressing method[1].When nitrogen gas is used as enviromental gas for hotpressing, this material becomes n-type semiconductor. It shows comparably high themoelectromotive force. Thermoelectric properties of this material change with the processing conditions.The relationship between thermoelectric properties and microstructure is also evaluated.


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