Effects of Leaf Surface Roughness and Five Adjuvant Types on Impacting Droplet Adhesion and Spread

2020 ◽  
pp. 128-139
Author(s):  
JohnPaul R. Abbott ◽  
Abigail E. Ambrose ◽  
Heping Zhu
Keyword(s):  
Surface Roughness ◽  
Leaf Surface

Leaf surface roughness influences colonization success of aquatic hyphomycete conidia

2008 ◽  
Vol 1 (1) ◽  
pp. 13-18 ◽  
Author(s):  
Sheamus G. Kearns ◽  
Felix Bärlocher
Keyword(s):  
Surface Roughness ◽  
Leaf Surface ◽  
Colonization Success

scholarly journals Roughness measurement of leaf surface based on shape from focus

Plant Methods ◽  
2021 ◽  
Vol 17 (1) ◽  
Author(s):  
Zeqing Zhang ◽  
Fei Liu ◽  
Zhenjiang Zhou ◽  
Yong He ◽  
Hui Fang
Keyword(s):  
Surface Roughness ◽  
Leaf Surface ◽  
Imaging System ◽  
Distortion Correction ◽  
Small Scale ◽  
Plant Leaves ◽  
Roughness Measurement ◽  
Pixel Intensity ◽  
Object Distance ◽  
Shape From Focus

Abstract Background Surface roughness has a significant effect on leaf wettability. Consequently, it influences the efficiency and effectiveness of pesticide application. Therefore, roughness measurement of leaf surface offers support to the relevant research efforts. To characterize surface roughness, the prevailing methods have drawn support from large equipment that often come with high costs and poor portability, which is not suitable for field measurement. Additionally, such equipment may even suffer from inherent drawbacks like the absence of relationship between pixel intensity and corresponding height for scanning electron microscope (SEM). Results An imaging system with variable object distance was created to capture images of plant leaves, and a method based on shape from focus (SFF) was proposed. The given space-variantly blurred images were processed with the proposed algorithm to obtain the surface roughness of plant leaves. The algorithm improves the current SFF method through image alignment, focus distortion correction, and the introduction of NaN values that allows it to be applied for precise 3d-reconstruction and small-scale surface roughness measurement. Conclusion Compared with methods that rely on optical three-dimensional interference microscope, the method proposed in this paper preserves the overall topography of leaf surface, and achieves superior cost performance at the same time. It is clear from experiments on standard gauge blocks that the RMSE of step was approximately 4.44 µm. Furthermore, according to the Friedman/Nemenyi test, the focus measure operator SML was expected to demonstrate the best performance.

3D optical surface profiler for quantifying leaf surface roughness

2019 ◽  
Vol 7 (4) ◽  
pp. 045016
Author(s):  
JohnPaul R Abbott ◽  
Heping Zhu
Keyword(s):  
Surface Roughness ◽  
Leaf Surface ◽  
Optical Surface

The influence of leaf surface roughness on the spreading of oil spray drops

1976 ◽  
Vol 84 (2) ◽  
pp. 205-211 ◽  
Author(s):  
L. BOIZE ◽  
C. GUDIN ◽  
G. PURDUE
Keyword(s):  
Surface Roughness ◽  
Leaf Surface

Methods for evaluating leaf surface free energy and polarity having accounted for surface roughness

2017 ◽  
Vol 73 (9) ◽  
pp. 1854-1865 ◽  
Author(s):  
Justin J Nairn ◽  
W Alison Forster
Keyword(s):  
Surface Roughness ◽  
Free Energy ◽  
Surface Free Energy ◽  
Leaf Surface

scholarly journals Leaf surface roughness measure based on shape from focus

2021 ◽  
Author(s):  
Zeqing Zhang ◽  
Fei Liu ◽  
Zhenjiang Zhou ◽  
Yong He ◽  
Hui Fang
Keyword(s):  
Surface Roughness ◽  
Leaf Surface ◽  
Imaging System ◽  
Three Dimensional ◽  
Distortion Correction ◽  
Small Scale ◽  
Plant Leaves ◽  
Pixel Intensity ◽  
Object Distance ◽  
Shape From Focus

Abstract BackgroundSurface roughness has a significant effect on leaf wettability, consequently influencing the efficiency and effectiveness of pesticide spraying application. Therefore, surface roughness measure of plant leaves is conducive to relevant researches. In order to characterize the surface roughness, present methods have to draw support from large apparatus, but they are generally high-cost and not portable enough for field measurement. Methods those instruments even have potentially inherent drawback such as absence of relation between pixel intensity and corresponding height for scanning electron microscope (SEM). ResultsAn imaging system with variable object distance is set up to capture images of plant leaves and a shape from focus (SFF) based method is proposed. These space-variantly blurred images are processed with the proposed algorithm to yield surface roughness of plant leaves. The algorithm mainly improves the current SFF method in image alignment, focus distortion correction, and NaN values introducing to make it applicative for precise 3d-reconstruction and surface roughness measure in small scale. ConclusionCompared with method via optical three-dimensional interference microscope, the proposed method preserves the overall topography of leaf surface and meanwhile achieves superior cost performance. Experiments on standard gauge blocks revealed the RMSE of step was approximately 4.44μm. Furthermore, the focus measure operator SML was supposed to perform best according to Friedman/Nemenyi test.

Comparison of leaf surface roughness analysis methods by sensitivity to noise analysis

2015 ◽  
Vol 136 ◽  
pp. 77-86 ◽  
Author(s):  
Houda Bediaf ◽  
Rachid Sabre ◽  
Ludovic Journaux ◽  
Frédéric Cointault
Keyword(s):  
Surface Roughness ◽  
Leaf Surface ◽  
Noise Analysis ◽  
Analysis Methods ◽  
Roughness Analysis

Roughness measurements of nonlinear optical polymer films by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 22-23
Author(s):  
I. H. Musselman ◽  
R.-T. Chen ◽  
P. E. Russell
Keyword(s):  
Surface Roughness ◽  
Scanning Tunneling Microscopy ◽  
Nonlinear Optical ◽  
Polymer Surface ◽  
Light Extinction ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Tunneling Microscopy ◽  
Optical Polymer ◽  
Total Light

Scanning tunneling microscopy (STM) has been used to characterize the surface roughness of nonlinear optical (NLO) polymers. A review of STM of polymer surfaces is included in this volume. The NLO polymers are instrumental in the development of electrooptical waveguide devices, the most fundamental of which is the modulator. The most common modulator design is the Mach Zehnder interferometer, in which the input light is split into two legs and then recombined into a common output within the two dimensional waveguide. A π phase retardation, resulting in total light extinction at the output of the interferometer, can be achieved by changing the refractive index of one leg with respect to the other using the electrooptic effect. For best device performance, it is essential that the NLO polymer exhibit minimal surface roughness in order to reduce light scattering. Scanning tunneling microscopy, with its high lateral and vertical resolution, is capable of quantifying the NLO polymer surface roughness induced by processing. Results are presented below in which STM was used to measure the surface roughness of films produced by spin-coating NLO-active polymers onto silicon substrates.

Surface roughness measurements of vanadium-contaminated fluidized cracking catalysts by atomic force microscopy

1996 ◽  
Vol 54 ◽  
pp. 866-867
Author(s):  
H. Kinney ◽  
M.L. Occelli ◽  
S.A.C. Gould
Keyword(s):  
Surface Roughness ◽  
Zeolite Y ◽  
Atomic Level ◽  
Microporous Structure ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Roughness Measurements ◽  
Cracking Catalysts

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

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