The adhesion energy between polymer thin films and self-assembled monolayers

1998 ◽  
Vol 13 (12) ◽  
pp. 3555-3564 ◽  
Author(s):  
Andrew V. Zhuk ◽  
Anthony G. Evans ◽  
John W. Hutchinson ◽  
George M. Whitesides
Keyword(s):  
Thin Films ◽  
Fracture Energy ◽  
Crack Growth ◽  
Interface Crack ◽  
Adhesion Energy ◽  
Self Assembled Monolayers ◽  
Si Substrates ◽  
Surface Energies ◽  
Assembled Monolayers ◽  
Self Assembled

A superlayer test has been adapted for the measurement of the fracture energy between epoxy thin films and self-assembled monolayers (SAM's) on Au/Ti/Si substrates. The “arrest” mode of analysis has been shown to provide consistent results, particularly when relatively wide lines are used to encourage lateral decohesions. The fracture energy, Γi, of the interface between the monolayer and the epoxy is varied by adjusting the ratio of COOH/CH3 terminal groups. Connections among Γi, the surface energies, and the inelastic deformations occurring in the epoxy are explored upon comparison with interface crack growth simulations.

Self-assembled Monolayers Preparation and Characterization of BiFeO3 Thin Films

2009 ◽  
Vol 25 (1) ◽  
pp. 83-86 ◽  
Author(s):  
Guo-Qiang TAN ◽  
Hai-Yang BO ◽  
Hong-Yan MIAO ◽  
Ao XIA ◽  
Zhong-Liang HE
Keyword(s):  
Thin Films ◽  
Self Assembled Monolayers ◽  
Assembled Monolayers ◽  
Self Assembled

Nanoporous Thin Films Formed from Photocleavable Diblock Copolymers on Gold Substrates Modified with Thiolate Self-Assembled Monolayers

Langmuir ◽  
2020 ◽  
Vol 36 (31) ◽  
pp. 9259-9268 ◽  
Author(s):  
Takashi Ito ◽  
Herman Coceancigh ◽  
Yi Yi ◽  
Jay N. Sharma ◽  
Fred C. Parks ◽  
...  
Keyword(s):  
Thin Films ◽  
Diblock Copolymers ◽  
Self Assembled Monolayers ◽  
Gold Substrates ◽  
Assembled Monolayers ◽  
Self Assembled

Interfacial Adhesion of Cu to Self-Assembled Monolayers on SiO2

2001 ◽  
Vol 695 ◽  
Author(s):  
G. Cui ◽  
M. Lane ◽  
K. Vijayamohanan ◽  
G. Ramanath
Keyword(s):  
Binding Energy ◽  
Photoelectron Spectroscopy ◽  
Interfacial Adhesion ◽  
Adhesion Energy ◽  
Binding Energies ◽  
Self Assembled Monolayers ◽  
Chemical Binding ◽  
Barrier Materials ◽  
Assembled Monolayers ◽  
Self Assembled

ABSTRACTAs the critical feature size in microelectronic devices continues to decrease below 100 nm, new barrier materials of > 5 nm thickness are required. Recently we have shown that self-assembled monolayers (SAMs) are attractive candidates that inhibit Cu diffusion into SiO2. For SAMs to be used as barriers in real applications, however, they must also promote adhesion at the Cu/dielectric interfaces. Here, we report preliminary quantitative measurements of interfacial adhesion energy and chemical binding energy of Cu/SiO2 interfaces treated with nitrogen-terminated SAMs. Amine-containing SAMs show a ~10% higher adhesion energy with Cu, while interfaces with Cu-pyridine bonds actually show degraded adhesion, when compared with that of the reference Cu/SiN interface. However, X-ray photoelectron spectroscopy (XPS) measurements show that Cu-pyridine and Cu-amine interactions have a factor-of-four higher binding energy than that of Cu-N bonds at Cu/SiN interfaces. The lack of correlation between adhesion and chemical binding energies is most likely due to incomplete coverage of SAMs.

Formation and stability of porphyrin and phthalocyanine self-assembled monolayers on ZnO surfaces

2016 ◽  
Vol 20 (08n11) ◽  
pp. 1264-1271 ◽  
Author(s):  
Hanna Hakola ◽  
Essi Sariola-Leikas ◽  
Paavo Jäntti ◽  
Thomas Mokus ◽  
Kati Stranius ◽  
...  
Keyword(s):  
Thin Films ◽  
Zno Nanorods ◽  
Self Assembled Monolayers ◽  
Layer Formation ◽  
Zno Film ◽  
Assembled Monolayers ◽  
Self Assembled ◽  
Anchoring Groups ◽  
The Stability ◽  
Phosphate Groups

Formation of self-assembled monolayers (SAMs) of three porphyrin and one phthalocyanine derivatives on thin ZnO film was studied by monitoring absorption spectra of the samples. The compounds were equipped with carboxylic or phosphate groups to bind to the surface. The SAM formation was found to be fast. The layer was formed in less than 15 min for all studied porphyrins, and 30 min was sufficient to form phthalocyanine layer. For porphyrins with different anchor groups the SAM formation was too fast to see any difference between the anchoring groups. The stability of SAMs was tested then by immersing the samples into neat solvents. Upon immersion the SAMs were gradually losing the absorbance for all the compounds with degradation trends being in line with p[Formula: see text] values of the binding groups of the same type. However, even for the weakest binding group the SAM was relatively stable after a few tens of minutes of washing, which was sufficient to remove physisorbed compounds but the SAM was essentially not destroyed. Comparison of SAMs on thin films with SAMs on ZnO nanorods and TiO2 nanoparticle films indicated the same fast layer formation but relatively weaker SAMs stability, showing 20–40% faster absorption losses during the washing.

The influence of 2D nanomaterials on electron transfer across molecular thin films

2019 ◽  
Vol 4 (2) ◽  
pp. 431-436
Author(s):  
Na Kong ◽  
Shuang Zhang ◽  
Jing Liu ◽  
Jianmei Wang ◽  
Zhen Liu ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Transfer ◽  
Self Assembled Monolayers ◽  
Assembled Monolayers ◽  
2D Nanomaterials ◽  
Electron Transfer Pathways ◽  
Molecular Thin Films ◽  
Self Assembled

Design and formation of electron transfer pathways across self-assembled monolayers by the hydrophobic attachment of BN-NH2 and MoS2 nanosheets.

Controlled Assembly of Patterned Gold Thin Films Using Photolithographed Self-assembled Monolayers as Templates

1997 ◽  
Vol 26 (11) ◽  
pp. 1147-1148 ◽  
Author(s):  
Junfu Liu ◽  
Lingang Zhang ◽  
Pansong Mao ◽  
Deying Chen ◽  
Ning Gu ◽  
...  
Keyword(s):  
Thin Films ◽  
Self Assembled Monolayers ◽  
Controlled Assembly ◽  
Assembled Monolayers ◽  
Gold Thin Films ◽  
Self Assembled

ChemInform Abstract: Synthesis of ZrO2 and Y2O3-Doped ZrO2 Thin Films Using Self-Assembled Monolayers.

ChemInform ◽  
2010 ◽  
Vol 29 (16) ◽  
pp. no-no
Author(s):  
M. AGARWAL ◽  
M. R. DE GUIRE ◽  
A. H. HEUER
Keyword(s):  
Thin Films ◽  
Self Assembled Monolayers ◽  
Assembled Monolayers ◽  
Self Assembled
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