scholarly journals Ferroelectricity of Lead-Zirconate-Titanate Thin Films Prepared by Laser Ablation

1991 ◽  
Vol 243 ◽  
Author(s):  
Toshio Ogawa ◽  
Hideo Kidoh ◽  
Hideyuki Yashima ◽  
Akiharu Morimoto ◽  
Tatsuo Shimizu
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Lead Zirconate Titanate ◽  
Remanent Polarization ◽  
Lead Zirconate ◽  
Excimer Laser Ablation ◽  
Sapphire Substrates ◽  
Zirconate Titanate ◽  
Effective Voltage ◽  
Large Remanent Polarization

AbstractLead-zirconate-titanate films were prepared by excimer laser ablation. The coercive field of films deposited on MgO substrates with an electrode was lower than that of films deposited on sapphire substrates. Laser fluence influenced the grain and crystalline size, resulting in a change in the Ec. Film thicknesses were varied over a range from 0.3 to 2.41μm, with the thinnest film showing a large remanent polarization even at an applied effective voltage of 5V.

Lead Zirconate-Titanate Thin Films Prepared by the Laser Ablation Technique

1990 ◽  
Vol 200 ◽  
Author(s):  
C. K. Chiang ◽  
L. P. Cook ◽  
P. K. Schenck ◽  
P. S. Brody ◽  
J. M. Benedetto
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray ◽  
Ablation Technique ◽  
Zirconate Titanate ◽  
Deposited Films ◽  
Plate Type ◽  
Laser Ablation Technique

ABSTRACTLead zirconate-titanate (PZT) thin films were prepared by the laser ablation technique. The PZT (Zr/Ti=53/47) target was irradiated using a focused q-switched Nd:YAG laser (15 ns, 100 mJ at 1.064 μ;m). The as-deposited films were amorphous as indicated by X-ray powder patterns, but crystallized readily with brief annealing above 650°C. The dielectric constant and the resistivity of the crystallized films were studied using a parallel-plate type capacitor structure.

Lead Zirconate Titanate Thin Films on Silicon-on-Sapphire Substrates

2019 ◽  
Author(s):  
Robert R. Benoit ◽  
Nicholas A. Strnad ◽  
Daniel M Potrenka ◽  
Brendan M. Hanrahan ◽  
Steven K. Isaacson ◽  
...  
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Sapphire Substrates ◽  
Zirconate Titanate

Influence of Laser Fluence on Structural and Ferroelectric Properties of Lead-Zirconate-Titanate Thin Films Prepared by Laser Ablation

1991 ◽  
Vol 30 (Part 1, No. 9B) ◽  
pp. 2167-2169 ◽  
Author(s):  
Hideo Kidoh ◽  
Toshio Ogawa ◽  
Hideyuki Yashima ◽  
Akiharu Morimoto ◽  
Tatsuo Shimizu
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Lead Zirconate Titanate ◽  
Laser Fluence ◽  
Ferroelectric Properties ◽  
Lead Zirconate ◽  
Zirconate Titanate
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