Lead Zirconate-Titanate Thin Films Prepared by the Laser Ablation Technique

1990 ◽  
Vol 200 ◽  
Author(s):  
C. K. Chiang ◽  
L. P. Cook ◽  
P. K. Schenck ◽  
P. S. Brody ◽  
J. M. Benedetto
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray ◽  
Ablation Technique ◽  
Zirconate Titanate ◽  
Deposited Films ◽  
Plate Type ◽  
Laser Ablation Technique

ABSTRACTLead zirconate-titanate (PZT) thin films were prepared by the laser ablation technique. The PZT (Zr/Ti=53/47) target was irradiated using a focused q-switched Nd:YAG laser (15 ns, 100 mJ at 1.064 μ;m). The as-deposited films were amorphous as indicated by X-ray powder patterns, but crystallized readily with brief annealing above 650°C. The dielectric constant and the resistivity of the crystallized films were studied using a parallel-plate type capacitor structure.

Characterization of Lead Zirconate-Titanate Thin Films Prepared by Pulsed Laser Deposition

1991 ◽  
Vol 230 ◽  
Author(s):  
C. K. Chiang ◽  
W. Wong-Ng ◽  
P. K. Schenck ◽  
L. P. Cook ◽  
M. D. Vaudin ◽  
...  
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Laser Deposition ◽  
Scanning Calorimetry ◽  
X Ray ◽  
Zirconate Titanate ◽  
Deposited Films ◽  
Post Deposition

AbstractDense smooth lead zirconate-titanate thin films have been prepared by excimer laser deposition. The as-deposited films are amorphous as indicated by x-ray powder patterns. Differential scanning calorimetry studies show that the film has a glass transition at 301 °C, and the amorphous to crystalline transformation takes place above 350°C to 650°C. Phase formation as a result of post-deposition heat treatment is described.

In-situ X-ray studies of phase transformations in lead zirconate titanate thin films during annealing

1995 ◽  
Vol 268 (1-2) ◽  
pp. 102-107 ◽  
Author(s):  
P. Aungkavattana ◽  
B. Haartz ◽  
C.O. Ruud ◽  
S. Trolier-McKinstry
Keyword(s):  
Thin Films ◽  
Phase Transformations ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray ◽  
Zirconate Titanate

Laser Ablation of Highly Oriented Cdse Thin Films and Cdte/Cdse Multilayers on Silicon Substrate

1995 ◽  
Vol 397 ◽  
Author(s):  
M. Ambrico ◽  
R. Martino ◽  
D. Smaldone ◽  
V. Capozzi ◽  
G. Lorusso ◽  
...  
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Substrate Temperature ◽  
Silicon Substrate ◽  
X Ray ◽  
Si Films ◽  
Polycrystalline Structures ◽  
High Orientation ◽  
Deposited Films ◽  
Laser Ablation Technique

ABSTRACTLaser ablation technique has been successfully used for the deposition of CdSe and CdTe/CdSe multilayers on Si(100) and Si(l11) substrates. X-ray analysis showed that CdSe/Si films were highly oriented. Their orientation changed from (100) to (002) by varying the substrate temperature from 473 to 673K. High orientation was also obtained on multilayered polycrystalline structures of CdSe and CdTe on Si(lll). Photoluminescence experiments have also been carried out on the deposited films.

Influence of Laser Fluence on Structural and Ferroelectric Properties of Lead-Zirconate-Titanate Thin Films Prepared by Laser Ablation

1991 ◽  
Vol 30 (Part 1, No. 9B) ◽  
pp. 2167-2169 ◽  
Author(s):  
Hideo Kidoh ◽  
Toshio Ogawa ◽  
Hideyuki Yashima ◽  
Akiharu Morimoto ◽  
Tatsuo Shimizu
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Lead Zirconate Titanate ◽  
Laser Fluence ◽  
Ferroelectric Properties ◽  
Lead Zirconate ◽  
Zirconate Titanate

Effects of high energy x ray and proton irradiation on lead zirconate titanate thin films' dielectric and piezoelectric response

2013 ◽  
Vol 102 (19) ◽  
pp. 192906 ◽  
Author(s):  
Y. Bastani ◽  
A. Y. Cortés-Peña ◽  
A. D. Wilson ◽  
S. Gerardin ◽  
M. Bagatin ◽  
...  
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Proton Irradiation ◽  
Lead Zirconate ◽  
High Energy ◽  
Piezoelectric Response ◽  
X Ray ◽  
Zirconate Titanate
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