Perpendicular Magnetoresistance of Microstructured Pillars in Fe/Cr Magnetic Multilayers
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ABSTRACTWe have fabricated pillar-like microstructures of high vacuum sputtered Fe/Cr Magnetic Multilayers and measured the giant magnetoresistance effect in the configuration where the measuring current is perpendicular to the film plane from 4.2 K to 300 K. At 4.2 K we find a magnetoresistance of 108 % for multilayers with a Fe thickness of 3 nm and a Cr thickness of 1 nm. The pronounced temperature dependence of the perpendicular magnetoresistance is studied for samples with different Cr thicknesses and tentatively explained by electron-Magnon scattering. The low-temperature data are compared with existing low-temperáture models.
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2001 ◽
Vol 64
(6)
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pp. 605-611
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1998 ◽
Vol 177-181
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pp. 884-885
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