Analysis of Interface Dynamics in Solid-State Phase Transformations by In Situ Hot-Stage High-Resolution Transmission Electron Microscopy

1994 ◽  
Vol 332 ◽  
Author(s):  
James M. Howe ◽  
W. E. Benson ◽  
A. Garg ◽  
Y.-C. Chang

ABSTRACTIn situ hot-stage high-resolution transmission electron microscopy (HRTEM) provides unique capabilities for quantifying the dynamics of interfaces at the atomic level. Such information is critical for understanding the theory of interfaces and solid-state phase transformations. This paper provides a brief description of particular requirements for performing in situ hot-stage HRTEM, summarizes different types of in situ HRTEM investigations and illustrates the use of this technique to obtain quantitative data on the atomic mechanisms and kinetics of interface motion in precipitation, crystallization and martensitic reactions. Some limitations of in situ hot-stage HRTEM and future prospects of this technique are also discussed.

1989 ◽  
Vol 169 ◽  
Author(s):  
C. P. Burmester ◽  
L. T. Wille ◽  
R. Gronsky ◽  
B. T. Ahn ◽  
V. Y. Lee ◽  
...  

AbstractHigh resolution transmission electron microscopy during in‐situ quenching of YBa2Cu3Oz is used to study the kinetics of microdomain formation during oxygen loss in this system. Image simulations based on atomic models of oxygen‐vacancy order in the basal plane of this material generated by Monte Carlo calculations are used to interpret high resolution micrographs of the structures obtained by quenching. The observed domain structures agree well with those obtained from the simualtions.


1985 ◽  
Vol 62 ◽  
Author(s):  
M. A. Parker ◽  
T. W. Sigmon ◽  
R. Sinclair

ABSTRACTA technique has been developed which employs high resolution transmission electron microscopy (HRTEM) for the observation of the atomic mechanisms associated with solid state phase transformation as they occur at elevated temperatures. It consists of the annealing in-situ of cross-section transmission electron microscopy (TEM) specimens that have been favorably oriented for lattice fringe imaging and the video-recording of dynamic events as they occur in real-time. By means of this technique, we report the first video-recorded lattice images of crystallographic defect motion in silicon, viz. the motion of dislocations and stacking faults, as well as the first such images of the atomic mechanisms responsible for the amorphous to crystalline (a-c) phase transformation, viz. heterogeneous nucleation of crystal nuclei, coalescence of crystal nuclei by co-operative atomic processes, ledge motion at the growth interface, and normal growth in silicon. This technique holds great potential for the elucidation of the atomic mechanisms involved in reaction kinetics in the solid state.


Author(s):  
J. M. Howe

In situ hot-stage high-resolution transmission electron microscopy (HRTEM) provides unique capabilities for quantifying the dynamics of interfaces at the atomic level. Such information complements detailed static observations and calculations of interfacial structure, and is essential for understanding interface theory and solid-state phase transformations. This paper provides a brief description of particular requirements for performing in situ hot-stage HRTEM and illustrates the use of this technique to obtain quantitative data on the atomic mechanisms and kinetics of interface motion during precipitation of {111} θ phase in an Al-Cu-Mg-Ag alloy.The specimen and microscope requirements for in situ hot-stage HRTEM are not much different from those of static HRTEM, except that one must have a heating holder and equipment for recording and analyzing dynamic images. At present, most HRTEMs are equipped with a TV-rate camera, possibly combined with a charge-coupled device camera. An inexpensive way to record in situ HRTEM images is to send the output from the TV-rate camera directly into a standard VHS format videocassette recorder (VCR).


1998 ◽  
Vol 13 (4) ◽  
pp. 974-978 ◽  
Author(s):  
Seong-Hyeon Hong ◽  
Naesung Lee ◽  
Altaf H. Carim ◽  
Gary L. Messing

Interfacial precipitation in sol-gel derived, titania-doped diphasic mullite gels was investigated using conventional and high resolution transmission electron microscopy. Rutile, anatase, and brookite precipitated on the interface between {110} planes of mullite and glass pockets in the sintered body. The formation of brookite may be attributable to the Si- and Al-rich environment during precipitation. Each polymorph of titania has a unique morphology and orientation relationship with mullite. Brookite exhibits a truncated pill box shape, and anatase displays a vermicular morphology. Quenching experiments suggest that the precipitates grow and undergo phase transformations during cooling.


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