A Quantitative Model for the Metastable Defect Creation in Amorphous Semiconductors by Kev-Electron Irradiation

1994 ◽  
Vol 336 ◽  
Author(s):  
A. Scholz ◽  
B. Schröder ◽  
H. Oechsner
Keyword(s):  
Energy Dissipation ◽  
Electron Irradiation ◽  
Quantitative Agreement ◽  
Quantitative Model ◽  
Amorphous Semiconductor ◽  
Amorphous Semiconductors ◽  
Experimental Results ◽  
Defect Creation ◽  
Hydrogenated Amorphous ◽  
Metastable Defect

ABSTRACTThe interaction mechanisms of keV-electrons with the hydrogenated Amorphous semiconductor are briefly discussed and the differences to the metastable defect creation by photons are set out. Based on the knowlegde of the energy dissipation mechanisms of keV-electrons in the hydrogenated Amorphous semiconductor, a model for the creation of metastable defects by keV-electron irradiation is developed and its quantitative agreement with the experimental results is shown.

Vibrational Spectra for Hydrogenated Amorphous Semiconductors

1989 ◽  
Vol 166 ◽  
Author(s):  
W. A. Kamitakahara ◽  
R. Biswas ◽  
A. M. Bouchard ◽  
F. Gompf ◽  
J. B. Suck
Keyword(s):  
Neutron Scattering ◽  
Computer Simulations ◽  
Vibrational Spectra ◽  
Amorphous Semiconductor ◽  
Amorphous Semiconductors ◽  
Semiconductor Materials ◽  
Vibration Spectra ◽  
Hydrogenated Amorphous

ABSTRACTHydrogen vibration spectra have been measured by neutron scattering for several amorphous semiconductor materials, including a-Ge:H and a-SiC:H samples containing about 10 at. % H. The data for a-Ge:H are compared in detail with the results of realistic computer simulations.

Pulsed-Light-Induced Metastable Defect Creation in Hydrogenated Amorphous Silicon

1995 ◽  
Vol 377 ◽  
Author(s):  
Jong-Hwan Yoon ◽  
H. L. Kim
Keyword(s):  
Time Dependence ◽  
Amorphous Silicon ◽  
Defect Density ◽  
Hydrogenated Amorphous Silicon ◽  
Pulsed Light ◽  
Illumination Time ◽  
Defect Creation ◽  
Annealing Rate ◽  
Hydrogenated Amorphous ◽  
Metastable Defect

ABSTRACTWe report the results of a study of metastable defect creation by pulsed light soaking in undoped hydrogenated amorphous silicon (a-Si:H). An illumination time dependence of the defect density, a saturated defect density, and light-induced annealing under pulsed laser light have been studied. Measurements show approximately a t1/2 time-dependence of the defect creation, which is independent of light intensity. It is observed that the saturation value of the defect density is about one order of magnitude higher than by cw illumination in device quality films. It has been suggested that these results would be due to the difference in the light-induced defect annealing rate between cw and pulsed lights, in which it is found that the light-induced annealing rate by pulsed light is lower than by cw light.

Capacitance Studies of Metastable Defect Creation in Hydrogenated Amorphous Silicon

1986 ◽  
Vol 70 ◽  
Author(s):  
J. D. Cohen ◽  
K. Mahavadi ◽  
K. Zellama ◽  
J. P. Harbison ◽  
A. E. Delahoy
Keyword(s):  
Amorphous Silicon ◽  
Hydrogenated Amorphous Silicon ◽  
Microscopic Models ◽  
Deep State ◽  
Absorption Studies ◽  
Defect Creation ◽  
Metastable Effects ◽  
Gap States ◽  
Hydrogenated Amorphous ◽  
Metastable Defect

ABSTRACTWe have studied the light induced instability problem in hydrogenated amorphous silicon using junction capacitance techniques. These techniques are used to examine specific changes in the density of gap states, and occupation of gap states, for undoped a-Si:H samples after light saturation and for a series of partial anneal “states” which culminate in the original dark annealed state (state A). We find that the observed changes in the metastable occupied and unoccupied defects contradict the Si-Si bond breaking model and indicate at least two defect creation processes. In several samples we also find clear evidence that the metastable defect distribution near midgap has a slightly different energy distribution than the stable deep state (dangling bond) distribution. At the same time, these results seem to be qualitatively consistent with many aspects of recent ESR and optical absorption studies of metastable defect creation. We discuss these findings in terms of alternative possible microscopic models for metastable effects in a-Si:H.

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