The Origin of Resonance Phenomena in Reflection High-Energy Electron Diffraction

1995 ◽  
Vol 404 ◽  
Author(s):  
S. L. Dudarev ◽  
M. J. Whelan

AbstractResonance scattering of high-energy electrons is responsible for the appearance of bright features observed in reflection high-energy electron diffraction (RHEED) patterns and has found numerous applications in reflection electron microscopy and in RHEED studies of dynamics of molecular beam epitaxial growth of semiconductor crystals. In this paper we report on recent developments in theoretical understanding of the processes leading to resonance reflection of high-energy electrons from a crystal surface.

1996 ◽  
Vol 10 (02) ◽  
pp. 133-168 ◽  
Author(s):  
S.L. DUDAREV ◽  
M.J. WHELAN

In this review we summarize the results of recent experimental and theoretical studies of the phenomenon known as resonance scattering of high-energy electrons from crystal surfaces. Resonance scattering is responsible for the appearance of bright features observed in reflection high-energy electron diffraction (RHEED) patterns and has found numerous applications in reflection electron microscopy and in RHEED studies of dynamics of molecular beam epitaxial growth of semiconductor crystals. The origin of the effect remained obscure for more than sixty years following the discovery of resonance scattering by Kikuchi and Nakagawa in 1933. Below we review theoretical models of the phenomenon which have been developed recently and which have provided the basis for understanding of the mechanism of resonance scattering. We conclude the review with a list of presently unsolved problems which, as we hope, can stimulate future progress in the theory of RHEED.


1999 ◽  
Vol 55 (2) ◽  
pp. 197-203 ◽  
Author(s):  
G. R. Anstis

Enhanced reflection of fast electrons from a crystal surface and a decrease in the depth of penetration of the primary beam occurs when diffraction conditions are such as to set up a wave travelling just beneath the crystal surface. This is the surface resonance condition for reflection high-energy electron diffraction (RHEED). Quantitative prediction of these effects can be achieved by assuming that only the primary and two diffracted beams are significant. Expressions for the coefficient of reflection and the depth of penetration in terms of a few Fourier coefficients of an effective potential are derived. These coefficients depend sensitively on incident-beam direction and are significantly different from the values for the bulk crystal. In particular, the mean potential experienced by the electrons in the resonance state is increased. It can be estimated using Bethe's perturbation approach. Predictions of the position, height and width of the peak in reflectivity resulting from resonance scattering from the (111) surface of platinum are in reasonable agreement with the values obtained from many-beam computations. The three-beam approach gives insight into resonance scattering using the standard formalism of diffraction theory.


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