Single-Crystal Fine-Positioning Devices for Scanned-Probe Microscopies

1995 ◽  
Vol 406 ◽  
Author(s):  
R. N. Kleiman

AbstractWe have developed a novel fine-positioning device for scanned-probe microscopies. Instead of the conventional scanner tube made of ceramic PZT material, we have constructed analogous structures from single-crystal piezoelectric wafers. Single-crystal materials, in particular Lithium Niobate, are available which solve many of the problems inherent with PZT. In addition, their superior thermal and mechanical properties lead to improved performance in a number of significant ways. We discuss the actual implementation of this idea in the construction of a scanner, possible applications for this design, and briefly discuss results obtained.

2017 ◽  
Vol 460 ◽  
pp. 42-47 ◽  
Author(s):  
A. Thirunavukkarsu ◽  
T. Sujatha ◽  
P.R. Umarani ◽  
M. Nizam Mohideen ◽  
A. Silambarasan ◽  
...  

2017 ◽  
Vol 1 (6) ◽  
pp. 1107-1117 ◽  
Author(s):  
Sonia Sonia ◽  
N. Vijayan ◽  
Mahak Vij ◽  
Prashant Kumar ◽  
Budhendra Singh ◽  
...  

A good quality single crystal was grown by adopting a slow evaporation solution growth technique. The optical, thermal and mechanical properties of the title compound were examined to determine its suitability for device fabrication.


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