Influence of Preparation Conditions on Charge Carrier Dynamics In a-Si:H Determined By An In-Siju Technique
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ABSTRACTContactless photoconductivity measurements with the time-resolved microwave conductivity technique have been performed during the growth of hydrogenated amorphous silicon films. it has been shown that low substrate temperature and thin films lead to a larger electron decay rate and to an increased infrared absorption compared with high quality films. Addition of H2S to SiH4 during the glow discharge process leads to a worse fi1m quality which can be detected in-situ.
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2006 ◽
Vol 352
(9-20)
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pp. 1416-1420
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2017 ◽
Vol 121
(43)
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pp. 10157-10165
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2006 ◽
Vol 86
(9)
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pp. 1261-1276
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