SiC-Seeded Crystal Growth

MRS Bulletin ◽  
1997 ◽  
Vol 22 (3) ◽  
pp. 30-35 ◽  
Author(s):  
R.C. Glass ◽  
D. Henshall ◽  
V.F. Tsvetkov ◽  
C.H. Carter

To take advantage of the superior properties of SiC-based devices, the industry must be able to produce high-quality SiC homoepitaxial films on single-crystal SiC wafers. Silicon- and GaAs-based semiconductor devices have taken advantage of the industry's ability to produce largediameter, high-quality substrates to develop large-volume, low-cost devices. For the same reasons, the development of low-cost, high-quality single-crystal SiC substrates has been pursued since the first Lely (nonseeded growth process) platelets were used to make devices. Currently several groups (ATMI, USA; Northrop Grumman Research Center, USA; Okmetic Ltd., Finland; Nippon Steel Corporation, Japan; and our company, Cree Research, Inc., USA) are working toward SiC substrate fabrication. University researchers also play an important role in the search for solutions to fundamental outstanding issues. These efforts are important because the future success of the SiC industry is closely related to the successful development of the SiC bulk growth process.

2000 ◽  
Vol 66 (2-3) ◽  
pp. 303-308 ◽  
Author(s):  
C Salati ◽  
G Mignoni ◽  
M Zha ◽  
L Zanotti ◽  
C Mucchino ◽  
...  

2013 ◽  
Vol 363 ◽  
pp. 128-131 ◽  
Author(s):  
Yiming Cao ◽  
Shujuan Yuan ◽  
Ming Liu ◽  
Baojuan Kang ◽  
Bo Lu ◽  
...  

CrystEngComm ◽  
2020 ◽  
Vol 22 (47) ◽  
pp. 8236-8242
Author(s):  
Shu-yu Ning ◽  
Xinyu Yang ◽  
Yan Wang ◽  
Zhongwen Zhu ◽  
Jiuxing Zhang

A high-quality and large-sized GdB6 single crystal was successfully prepared by using the optical floating zone method to accurately control the temperature and composition of the molten zone.


2020 ◽  
Vol 1003 ◽  
pp. 247-253
Author(s):  
Zhi Xin Ma ◽  
Xiao Guo Bi ◽  
Xu Dong Liu ◽  
Xiao Dong Li ◽  
Ji Guang Li ◽  
...  

LYSO:Ce single crystal was widely manufactured by Czochralski method. Considering its high cost and the pollution of the crucible, we tried to prepare the crystal by Verneuil method. Unlike Czochralski method, the Verneuil method need the powders with excellent fluidity and high purity. By comparing the powders annealed at 1100°C,1200°C,1300°C,1400°C and 1500°C, we can obtained the needed powders at 1500°C. We also increased the content of silica to satisfy the volatilization in crystal growth process. The single crystal was prepared by changing the growth parameter. We investigated the phase and the microstructure of the powders and observed the microstucture of the crystal fracture. We discussed the improved method of the process of crystal growth.


Sensors ◽  
2017 ◽  
Vol 17 (6) ◽  
pp. 1248 ◽  
Author(s):  
Fabrício Venâncio ◽  
Francisca Rosário ◽  
João Cajaiba

2012 ◽  
Vol 12 (6) ◽  
pp. 2923-2931 ◽  
Author(s):  
Eiji Hosono ◽  
Takashi Tokunaga ◽  
Shintaro Ueno ◽  
Yuya Oaki ◽  
Hiroaki Imai ◽  
...  

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