Studies on the Effect of Variable Angle Ramp Diffuser in Ramjet Engine

Author(s):  
M. Sudharson ◽  
Dr. David Rathnaraj J. ◽  
S. Yuvraj ◽  
K. Sathiyalingam ◽  
N. Vivek masthiraj
Keyword(s):  
Author(s):  
L. Mulestagno ◽  
J.C. Holzer ◽  
P. Fraundorf

Due to the wealth of information, both analytical and structural that can be obtained from it TEM always has been a favorite tool for the analysis of process-induced defects in semiconductor wafers. The only major disadvantage has always been, that the volume under study in the TEM is relatively small, making it difficult to locate low density defects, and sample preparation is a somewhat lengthy procedure. This problem has been somewhat alleviated by the availability of efficient low angle milling.Using a PIPS® variable angle ion -mill, manufactured by Gatan, we have been consistently obtaining planar specimens with a high quality thin area in excess of 5 × 104 μm2 in about half an hour (milling time), which has made it possible to locate defects at lower densities, or, for defects of relatively high density, obtain information which is statistically more significant (table 1).


2021 ◽  
Author(s):  
V. V. Svyatushenko ◽  
D. A. Yagodnikov ◽  
L. A. Rozanov

Author(s):  
Vito Giuseppe Monopoli ◽  
Abraham Marquez Alcaide ◽  
JOSE I. LEON ◽  
Marco Liserre ◽  
Giampaolo Buticchi ◽  
...  

1995 ◽  
Vol 306 (2-3) ◽  
pp. 313-321 ◽  
Author(s):  
Francisco García Sánchez ◽  
Alberto Fernández Gutierrez ◽  
Carmen Cruces Blanco

1984 ◽  
Vol 44 (11) ◽  
pp. 1041-1043 ◽  
Author(s):  
Chris M. Horwitz

1992 ◽  
Author(s):  
HIROSHI MIYAJIMA ◽  
NOBUO CHINZEI ◽  
TOHRU MITANI ◽  
YOSHIO WAKAMATSU ◽  
MASATAKA MAITA

Sign in / Sign up

Export Citation Format

Share Document