Optical Properties of GaN and Other III-Nitride Semiconductor Materials Studied by Variable Angle Spectroscopic Ellipsometry

2000 ◽  
Author(s):  
Huade W. Yao
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Semiconductor Materials ◽  
Variable Angle ◽  
Nitride Semiconductor ◽  
Variable Angle Spectroscopic Ellipsometry

Measurement of superlattice optical properties by variable angle spectroscopic ellipsometry

1988 ◽  
Vol 4 (1) ◽  
pp. 97-99 ◽  
Author(s):  
P.G. Snyder ◽  
B.N. De ◽  
K.G. Merkel ◽  
J.A. Woollam ◽  
D.W. Langer ◽  
...  
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Variable Angle ◽  
Variable Angle Spectroscopic Ellipsometry

Optical Properties of GaN Thin Films on Sapphire Substrates Characterized by Variable-Angle Spectroscopic Ellipsometry

1998 ◽  
Vol 37 (Part 2, No. 10A) ◽  
pp. L1105-L1108 ◽  
Author(s):  
Tao Yang ◽  
Shigeo Goto ◽  
Masahiko Kawata ◽  
Kenji Uchida ◽  
Atsuko Niwa ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Sapphire Substrates ◽  
Variable Angle ◽  
Variable Angle Spectroscopic Ellipsometry

Variable Angle Spectroscopic Ellipsometry Studies of HgI2

1993 ◽  
Vol 302 ◽  
Author(s):  
Huade Yao ◽  
Blaine Johs
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Room Temperature ◽  
Field Vector ◽  
Electric Field Vector ◽  
Aging Effects ◽  
Anisotropic Dielectric ◽  
Variable Angle ◽  
Variable Angle Spectroscopic Ellipsometry ◽  
Oriented Parallel

ABSTRACTVariable angle spectroscopic ellipsometry (VASE) measurements were employed to study the optical properties of HgI2. The bulk crystal HgI2 surface was subjected to a 10% KI etching prior to the VASE measurements. SE measurements were performed at room temperature, in air with several different angles of incidence. The uniaxial anisotropic nature of the HgI2 crystal was treated in the VASE analysis. Anisotropic dielectric functions of single crystal HgI2, ε||(wo) and ε⊥(ω), for optical electric field vector oriented parallel and perpendicular to the c axis, respectively, were obtained in the range of ∼2.0 - 5.0 eV. Surface aging effects of the HgI2 crystal, after the 10% KI etching, were characterized by VASE.

scholarly journals Variable Angle Spectroscopic Ellipsometry Characterization of Reduced Graphene Oxide Stabilized with Poly(Sodium 4-Styrenesulfonate)

Coatings ◽  
2020 ◽  
Vol 10 (8) ◽  
pp. 743 ◽  
Author(s):  
Grazia Giuseppina Politano ◽  
Carlo Vena ◽  
Giovanni Desiderio ◽  
Carlo Versace
Keyword(s):  
Optical Properties ◽  
Graphene Oxide ◽  
Reduced Graphene Oxide ◽  
Spectroscopic Ellipsometry ◽  
Morphological Properties ◽  
Si Substrates ◽  
Variable Angle ◽  
Reduced Graphene ◽  
Variable Angle Spectroscopic Ellipsometry

Lately, the optical properties of Graphene Oxide (GO) and Reduced Graphene Oxide (RGO) films have been studied in the ultraviolet and visible spectral range. However, the accurate optical properties in the extended near-infrared and mid-infrared range have not been published yet. In this work, we report a Variable Angle Spectroscopic Ellipsometry (VASE) characterization of GO thin films dip-coated on SiO2/Si substrates and thermally reduced GO films in the 0.38–4.1 eV photon energy range. Moreover, the optical properties of RGO stabilized with poly(sodium 4-styrenesulfonate) (PSS) films dip-coated on SiO2/Si substrates are studied in the same range for the first time. The Lorentz optical models fit well with the experimental data. In addition, the morphological properties of the samples were investigated by Scanning Electron Microscopy (SEM) analysis.

Study of the optical properties of In0.52(AlxGa1−x)0.48As by variable angle spectroscopic ellipsometry

1995 ◽  
Vol 78 (1) ◽  
pp. 442-445 ◽  
Author(s):  
J.‐W. Pan ◽  
J.‐L. Shieh ◽  
J.‐H. Gau ◽  
J.‐I. Chyi ◽  
J.‐C. Lee ◽  
...  
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Variable Angle ◽  
Variable Angle Spectroscopic Ellipsometry
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