scholarly journals In situ study of the effect of Nitrate on the Electrochemical migration of Tin under Chloridecontaining Thin Electrolyte Layer

2016 ◽  
Vol 1 (1) ◽  
pp. 4-10
Author(s):  
Bokai Liao ◽  
Zhenyu Chen ◽  
Xingpeng Guo
Keyword(s):  
Electrochemical Migration ◽  
Electrolyte Layer ◽  
In Situ Study ◽  
Thin Electrolyte Layer

In situ study the dependence of electrochemical migration of tin on chloride

2013 ◽  
Vol 27 ◽  
pp. 63-68 ◽  
Author(s):  
Xiankang Zhong ◽  
Guoan Zhang ◽  
Yubin Qiu ◽  
Zhenyu Chen ◽  
Wenxin Zou ◽  
...  
Keyword(s):  
Electrochemical Migration ◽  
In Situ Study

Effect of Organic Acids on the Electrochemical Migration of Tin in Thin Electrolyte Layer

2019 ◽  
Vol 9 (1) ◽  
pp. 74-84 ◽  
Author(s):  
Bokai Liao ◽  
Hongyu Cen ◽  
Zhenyu Chen ◽  
Xingpeng Guo
Keyword(s):  
Organic Acids ◽  
Organic Acid ◽  
Optical Observations ◽  
Ex Situ ◽  
Anode Surface ◽  
Electrochemical Migration ◽  
Electrolyte Layer ◽  
Weak Organic Acids ◽  
Weak Organic Acid ◽  
Thin Electrolyte Layer

Background and Objective: The effects of representative solder flux residue weak organic acids on electrochemical migration (ECM) of tin in thin electrolyte layer were studied using a technique based on the coupling of in situ electrochemical measurements and optical observations, as well as ex situ characterizations. Methods and Results: The results showed that the increasing amount of weak organic acid decreased the probability of ECM and dendrites formed were mainly composed of metallic tin. Tin ions reacted with organic compound ions from hydrolysis of weak organic acids to form complexes with electronegativity, which retarded the transfer of tin ions. Some complexes can be oxidized to the insoluble tin oxides on the anode surface and blocked the dissolution of anode during tin ECM. Conclusion: The growth rate of tin dendrite was found to be limited by the dissociation of complexes. Mechanisms involved were proposed to explain the role of weak organic acid in the tin ECM.

Effect of citrate ions on the electrochemical migration of tin in thin electrolyte layer containing chloride ions

2016 ◽  
Vol 112 ◽  
pp. 393-401 ◽  
Author(s):  
Bokai Liao ◽  
Zhenyu Chen ◽  
Yubing Qiu ◽  
Guoan Zhang ◽  
Xingpeng Guo
Keyword(s):  
Chloride Ions ◽  
Electrochemical Migration ◽  
Electrolyte Layer ◽  
Thin Electrolyte Layer ◽  
Citrate Ions

In Situ Study the Electrochemical Migration of Tin under Unipolar Square Wave Electric Field

2013 ◽  
Vol 160 (11) ◽  
pp. D495-D500 ◽  
Author(s):  
Xiankang Zhong ◽  
Xingpeng Guo ◽  
Yubing Qiu ◽  
Zhenyu Chen ◽  
Guoan Zhang
Keyword(s):  
Electric Field ◽  
Electrochemical Migration ◽  
Square Wave ◽  
In Situ Study

scholarly journals Na2S-influenced electrochemical migration of tin in a thin electrolyte layer containing chloride ions

RSC Advances ◽  
2017 ◽  
Vol 7 (25) ◽  
pp. 15060-15070 ◽  
Author(s):  
Bokai Liao ◽  
Lisha Wei ◽  
Zhenyu Chen ◽  
Xingpeng Guo
Keyword(s):  
Chloride Ions ◽  
Electrochemical Migration ◽  
Schematic Diagram ◽  
High Concentration ◽  
Electrolyte Layer ◽  
Low Concentration ◽  
Thin Electrolyte Layer

A schematic diagram of the effect of Na2S concentration on the ECM behavior of tin, from low concentration to high concentration.

In Situ Study of the Electrochemical Migration of Tin under Bipolar Square Wave Voltage

2017 ◽  
Vol 164 (6) ◽  
pp. D342-D347 ◽  
Author(s):  
Xiankang Zhong ◽  
Longjun Chen ◽  
Junying Hu ◽  
Yufan Shi ◽  
Zhi Zhang ◽  
...  
Keyword(s):  
Electrochemical Migration ◽  
Square Wave ◽  
In Situ Study
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