scholarly journals Elemental Analysis of Five Major Elements in Six Month Old Seedlings among Twelve Provenances of Tecomella undulata (Smith) Seemann

2020 ◽  
Vol 8 (4) ◽  
pp. 381-385
Author(s):  
Satish Kumar ◽  
2018 ◽  
Vol 28 (01n02) ◽  
pp. 35-42
Author(s):  
Rafaela Debastiani ◽  
Livio Amaral ◽  
Johnny Ferraz Dias

In this paper, a Brazilian roasted ground coffee from a popular brand was analyzed using particle-induced X-ray emission (PIXE). The elemental analysis identified elements such as Mg, Al, Si, P, S, K, Ca, Ti, Mn, Fe, Cu, Zn and Rb. While K, Mg and P are major elements, Mn, Fe, Zn and Rb were found in trace amounts. The presence of rubidium as a trace element in the samples is discussed in view of its presence in Brazilian coffee, soil and other beverages.


2020 ◽  
Author(s):  
Avupati Venkata Surya Satyanarayana ◽  
Mokka Jagannadharao ◽  
Kemburu Chandra Mouli ◽  
Kollu Sai Satya Mounika

Abstract. Particle Induced X-ray Emission (PIXE) has been applied to a analytical tool for long range of major, minor and trace elemental analysis in Precambrian charnockites. PIXE is sensitive and non-destructive method for some elemental analysis in a variety of Precambrian charnockite rocks down to levels of a few parts per million and it is not valid for all remaining elements in the composition. The elements identified in the Precambrian charnokite rock are Cl, K, Ca, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Se, Br, Rb, Sr, Y, Zr, Nb, Mo, Ru, Ag, Pb are identified without exact values by PIXE but the elements minor F, major elements Na, Mg, Al, Si, P and Ba and traces of Co, Th and U not detected due to various reasons even though there present in the charnockites, because of PIXE which is operation at 3 MeV energy and characterization material of charnockite mineral investigated. In mineral characterization of charnockite rocks, elemental errors in concentration of the compositions explained by comparing with present and previous studies.


2014 ◽  
Vol 5 (1) ◽  
pp. 752-756
Author(s):  
Amir Pishkoo

In this study Proton Induced X-ray Emission (PIXE) and Rutherford Backscattering Spectrometry (RBS) as reliable and non-destructive techniques has been applied to compare thickness, major and trace elements of different brands of CD-R discs. Three elements, namely Ag, Ba, and Ti were found to be the major elements.


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