Life Testing, Reliability, and Multivariate Nonparametric Methods

1979 ◽  
Author(s):  
Saul Blumenthal ◽  
V. P. Bhapkar
Author(s):  
Vanderley Vasconcelos ◽  
WELLINGTON SOARES ◽  
Antonio Carlos Lopes da Costa ◽  
Raíssa Oliveira Marques

Author(s):  
Ehtesham Husain ◽  
Masood ul Haq

<p><span>The reliability (unreliability) and life testing are important topics in the field of engineering, electronic, <span>medicine, economic and many more, where we are interested in, life of components, human organs, <span>subsystem and system. Statistically, a probability distribution failure time (life time) of a certain form is <span>usually assumed to give reliability of a component for a system for each time t. Some well known <span>parametric life time models (T ≥ 0) are Exponential, Weibull, Inverse Weibull, Gamma, Lognormal, <span>normal ( T&gt;0 ; left truncated ) etc. </span></span></span></span></span></span></p><p><span><span><span><span><span><span><span>In this paper we consider a system that, has two components with independent but non-identical life time <span>probabilities explained by two distinct random variables say T<span>1 <span>and T<span>2 <span>, where T<span>1 <span>has a constant hazard <span>rate and T<span>2 <span>has an increasing hazard respectively </span></span></span></span></span></span></span></span><br /><br class="Apple-interchange-newline" /></span></span></span></span></span></span></span></span></span></p>


2016 ◽  
Vol 327 ◽  
pp. 394-400 ◽  
Author(s):  
Saurabh Saxena ◽  
Christopher Hendricks ◽  
Michael Pecht

2007 ◽  
Vol 3 (6) ◽  
pp. 397-401 ◽  
Author(s):  
Param Silvapulle ◽  
Xibin Zhang

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