scholarly journals Multifactor Authentication in Automated Teller Machine

Author(s):  
Vigneshwar Muriki

Abstract: Skimming of card details is the primary problem faced by many people in today’s world. This can be done in many ways. For instance, a thief can insert a small device into the machine and steal the information. When a person swipes or inserts a card, the details will be captured and stored. This problem can be solved using biometrics. Biometrics include fingerprint, iris, face, retina scanning, etc. This paper focused on solving this issue using fingerprint and iris recognition using OpenCV and propose a suitable method for this issue. Fingerprint and iris recognition are performed by identifying the keypoints and descriptors and matching those with the test data. Keywords: Biometrics, Fingerprint recognition, Iris recognition, Scale Invariant Feature Transform, Oriented FAST and Rotated BRIEF, OpenCV

2013 ◽  
Vol 347-350 ◽  
pp. 3469-3472 ◽  
Author(s):  
Wei Wu ◽  
Sen Lin ◽  
Hui Song

Compared with the traditional method of contact collection, contactless acquisition is the mainstream and trend of palm vein recognition. However, this method may lead to image deformation caused by no parallel of the palm plane and the sensor plane. In order to improve the limited effect of Scale Invariant Feature Transform (SIFT) about this problem, a better method of palm vein recognition which based on principle line SIFT is proposed. Based on the self-built database, this method is compared with the SIFT and other typical palm vein recognition methods, the experimental results show that our system can achieve the best performance.


2018 ◽  
Vol 7 (2.8) ◽  
pp. 353
Author(s):  
A Roshna Meeran ◽  
V Nithya

The paper focuses on the investigation of image processing of Electronic waste detection and identification in recycling process of all Electronic items. Some of actually collected images of E-wastes would be combined with other wastes. For object matching with scale in-variance the SIFT (Scale -Invariant- Feature Transform) is applied. This method detects the electronic waste found among other wastes and also estimates the amount of electronic waste detected the give set of wastes. The detection of electronics waste by this method is most efficient ways to detect automatically without any manual means.


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