Using conductive atomic force microscopy, current images and I – V characteristics of tin oxide thin films deposited at various substrate temperatures were obtained. When analyzing current images and I – V characteristics, it was found that tin oxide films formed at a higher substrate temperature consist of the SnO2 phase, however, they include local areas with increased resistance that contain the SnO phase.
We present a detailed Atomic Force Microscopy based study on the ionic transport properties of polyethylene oxide (PEO) thin films prepared under different conditions.