scholarly journals Ionic transport in the amorphous phase of semicrystalline polyethylene oxide thin films

Soft Matter ◽  
2017 ◽  
Vol 13 (33) ◽  
pp. 5597-5603 ◽  
Author(s):  
Daniel E. Martínez-Tong ◽  
Luis A. Miccio ◽  
Angel Alegria
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Transport Properties ◽  
Amorphous Phase ◽  
Polyethylene Oxide ◽  
Ionic Transport ◽  
Oxide Thin Films ◽  
Force Microscopy ◽  
Atomic Force

We present a detailed Atomic Force Microscopy based study on the ionic transport properties of polyethylene oxide (PEO) thin films prepared under different conditions.

ALBUMIN ADSORPTION ON OXIDE THIN FILMS STUDIED BY ATOMIC FORCE MICROSCOPY

2021 ◽  
pp. 1-14
Author(s):  
Denise Aparecida Tallarico ◽  
Angelo Luiz Gobbi ◽  
Pedro Iris Paulin Filho ◽  
Marcelo Eduardo Huguenin Maia da Costa ◽  
Pedro Augusto de Paula Nascente ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Oxide Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Albumin Adsorption

IDENTIFICATION OF NON-UNIFORM DISTRIBUTION OF ELECTRICAL CHARACTERISTICS AND PHASE COMPOSITION IN TIN OXIDE THIN FILMS BY CONDUCTIVE ATOMIC FORCE MICROSCOPY

2020 ◽  
pp. 95-102
Author(s):  
N. A. Davletkildeev ◽  
E. Yu. Mosur ◽  
D. V. Sokolov ◽  
I. A. Lobov
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Tin Oxide ◽  
Oxide Thin Films ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Areas ◽  
Substrate Temperatures ◽  
Tin Oxide Films

Using conductive atomic force microscopy, current images and I – V characteristics of tin oxide thin films deposited at various substrate temperatures were obtained. When analyzing current images and I – V characteristics, it was found that tin oxide films formed at a higher substrate temperature consist of the SnO2 phase, however, they include local areas with increased resistance that contain the SnO phase.

Thickness Dependence of Transport Properties of Epitaxial SrRuO3 Thin Films Grown on SrTiO3 Substrates

2001 ◽  
Vol 690 ◽  
Author(s):  
G. Herranz ◽  
F. Sánchez ◽  
M.V. García-Cuenca ◽  
C. Ferrater ◽  
M. Varela ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Transport Properties ◽  
Growth Mechanism ◽  
Thickness Dependence ◽  
Force Microscopy ◽  
Substrate Interface ◽  
Atomic Force ◽  
Film Substrate ◽  
Change Of Microstructure

ABSTRACTTo study the effect of the film/substrate interface in thin films we have analyzed the thickness dependence of the transport properties of SrRuO3 films grown on SrTiO3 substrates. Our data makes evident the failure of the so-called deadlayer model to describe the observed thickness dependence of the conductivity. This is interpreted as due to a non-monotonous change of microstructure as thickness increases. Indeed, Atomic Force Microscopy studies indicate substantial modifications of the growth mechanism with thickness.

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