Atomic force microscopy and spectroscopy studies of annealed Ce/Ti/Zr mixed oxide thin films prepared by sol–gel process

2006 ◽  
Vol 600 (18) ◽  
pp. 4361-4364 ◽  
Author(s):  
F.E. Ghodsi ◽  
F.Z. Tepehan ◽  
G.G. Tepehan
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Mixed Oxide ◽  
Sol Gel ◽  
Oxide Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Sol Gel Process ◽  
Spectroscopy Studies

ALBUMIN ADSORPTION ON OXIDE THIN FILMS STUDIED BY ATOMIC FORCE MICROSCOPY

2021 ◽  
pp. 1-14
Author(s):  
Denise Aparecida Tallarico ◽  
Angelo Luiz Gobbi ◽  
Pedro Iris Paulin Filho ◽  
Marcelo Eduardo Huguenin Maia da Costa ◽  
Pedro Augusto de Paula Nascente ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Oxide Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Albumin Adsorption

scholarly journals Preparation of (Pb,Ba)TiO3 powders and highly oriented thin films by a sol-gel process

2004 ◽  
Vol 19 (5) ◽  
pp. 1492-1498 ◽  
Author(s):  
Stacey W. Boland ◽  
Suresh C. Pillai ◽  
Wein-Duo Yang ◽  
Sossina M. Haile
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Chelating Agent ◽  
Titanium Isopropoxide ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
Force Microscopy ◽  
Molar Ratios ◽  
Atomic Force ◽  
Sol Gel Process

Solid solution Pb1-xBaxTiO3, with particular emphasis on Pb0.5Ba0.5TiO3, was prepared using a sol-gel process incorporating lead acetate trihydrate, barium acetate, and titanium isopropoxide as precursors, acetylacetone (2,4 pentanedione) as a chelating agent, and ethylene glycol as a solvent. The synthesis procedure was optimized by systematically varying acetylacetone: Ti and H2O:Ti molar ratios and calcination temperature. The resulting effects on sol and powder properties were studied using thermogravimetric analysis/differential scanning calorimetry, Fourier transform infrared spectroscopy, Brunauer-Emmett-Teller analysis, and x-ray diffraction (XRD). Crystallization of the perovskite structure occurred at a temperature as low as 450 °C. Thin films were prepared by spin coating on (100) MgO. Pyrolysis temperature and heating rate were varied, and the resultant film properties investigated using field-emission scanning electron microscopy, atomic force microscopy, and XRD. Under optimized conditions, highly oriented films were obtained at a crystallization temperature of 600 °C.

Phase separation in SiO2–TiO2 gel and glassy films studied by atomic force microscopy and transmission electron microscopy

2001 ◽  
Vol 16 (6) ◽  
pp. 1626-1631 ◽  
Author(s):  
A. Karthikeyan ◽  
Rui M. Almeida
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Phase Separation ◽  
Sol Gel ◽  
Force Microscopy ◽  
Pure Silica ◽  
Atomic Force ◽  
Transmission Electron

An investigation of phase separation phenomena in gel and glassy thin films of silica–titania, with TiO2 contents of 20 and 40 mol%, has been carried out by atomic force microscopy (AFM) and transmission electron microscopy (TEM). The thin films were prepared by spin coating of a precursor sol on silicon wafers. Both the TEM measurements (carried out on scrapped thin film flakes) and the AFM measurements (carried out on films coated on the silicon substrates) for samples with different heat treatments suggest that spinodal-like structural inhomogeneities occur in these samples, unlike the corresponding observations in pure silica films, which are known to be homogeneous. Changes in the microstructure of the films have been noticed with the thermal treatment, in agreement with earlier x-ray photoemission studies. The finer characteristic dimensions of the phase separated regions reveal that silica–titania samples prepared by sol-gel processing exhibit a more intimate mixing of the phases.

Comparison between the optical and surface properties of TiO2 and Ag/TiO2 thin films prepared by sol-gel process

2011 ◽  
Vol 1352 ◽  
Author(s):  
Marcelo M. Viana ◽  
Nelcy D. S. Mohallem
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Refraction Index ◽  
Titanium Isopropoxide ◽  
X Ray Diffraction ◽  
Tio2 Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Sol Gel Process

ABSTRACTColloidal precursor solutions, obtained from a mixture of titanium isopropoxide, isopropyl alcohol and silver nitrate, were used to fabricate amorphous TiO2 and Ag/TiO2 thin films by sol-gel process. The films were deposited on borosilicate substrates, which were heated at 400 °C for 30 minutes and cooled rapidly to the formation of amorphous coatings. The films were investigated by X-ray diffraction, scanning electron microscopy, atomic force microscopy and UV-vis spectroscopy. The thickness, roughness, refraction index, and particle size of the TiO2 and Ag/TiO2 films were determined and compared. Finally, hydrophobic-hydrophilic property was evaluated to the thin films produced.

Effect of Annealing Temperature on Surface Morphology of Lanthanum Phosphate (LaPO4) Nanostructures Thin Films

2012 ◽  
Vol 626 ◽  
pp. 302-305 ◽  
Author(s):  
A.Z. Zainurul ◽  
M. Rusop ◽  
Saifollah Abdullah
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Annealing Temperature ◽  
Sol Gel ◽  
Coating Process ◽  
Force Microscopy ◽  
Lanthanum Phosphate ◽  
Atomic Force ◽  
Eds Analysis

LaPO4 particles with different morphologies and sizes have been successfully synthesized via sol-gel spinned coating process. The aim of this paper is to investigate the effect of annealing on the morphology and formation of LaPO4 on thin films. Physical structural properties of LaPO4 was investigated using atomic force microscopy (AFM-XE100). EDS analysis was done to check on the formation of LaPO4.

Microstructure and Optical Properties of (Zr0.8, Sn0.2)TiO4 Thin Films Grown on Si(100) Substrates by a Sol-Gel Process

2005 ◽  
Vol 475-479 ◽  
pp. 3693-3696
Author(s):  
Wen Xiu Cheng ◽  
Ai Li Ding ◽  
Ping Sun Qiu
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
X Ray Diffraction ◽  
Indirect Transition ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Sol Gel Process ◽  
Surface Morphologies ◽  
Transition Type

Amorphous and crystalline (Zr0.8,Sn0.2)TiO4 （ZST） thin films deposited on Si(100) substrates have been prepared by a sol-gel process. The crystal structure and surface morphologies of the thin films have been studied by X-ray diffraction and atomic force microscopy. The crystalline ZST films on Si(100) substrata with a (111) orientation The refractive index n and extinction coefficient k of the amorphous and crystalline thin films were obtained by spectroscopy ellipsometry as a function of phone energy in the range from 0.7 to 5.4 eV. The absorption edges for amorphous and crystalline ZST are 3.83 and 3.51eV of indirect–transition type respectively.

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