Simultaneous OH, CH2O and flow field imaging of near blowoff dynamics

2022 ◽  
Author(s):  
Raghul Manosh Kumar ◽  
Subodh Adhikari ◽  
Benjamin L. Emerson ◽  
Christopher A. Fugger ◽  
Tim C. Lieuwen
Keyword(s):  
Flow Field ◽  
Field Imaging

scholarly journals Research on combustion flow field imaging method based on ray casting algorithm

AIP Advances ◽  
2019 ◽  
Vol 9 (5) ◽  
pp. 055022 ◽  
Author(s):  
Min Yao ◽  
Yueqi Zhang ◽  
Min Zhao ◽  
Ruipeng Guo ◽  
Jun Xu
Keyword(s):  
Flow Field ◽  
Imaging Method ◽  
Ray Casting ◽  
Combustion Flow ◽  
Ray Casting Algorithm ◽  
Field Imaging

Flow Field Imaging With Ultrasonic Guided Waves for Exploring Metallic Melts

2018 ◽  
Vol 65 (1) ◽  
pp. 112-119
Author(s):  
Mantvydas Kalibatas ◽  
Richard Nauber ◽  
Christian Kupsch ◽  
Jurgen Czarske
Keyword(s):  
Flow Field ◽  
Guided Waves ◽  
Ultrasonic Guided Waves ◽  
Metallic Melts ◽  
Field Imaging

Flow field imaging through sharp-edged atomic and molecular `notch' filters

2001 ◽  
Vol 12 (4) ◽  
pp. 442-451 ◽  
Author(s):  
Richard B Miles ◽  
Azer P Yalin ◽  
Zhen Tang ◽  
Sohail H Zaidi ◽  
Joseph N Forkey
Keyword(s):  
Flow Field ◽  
Notch Filters ◽  
Field Imaging

Recent advances in combustion flow-field imaging measurements in high-pressure liquid-fueled gas turbine combustor concepts

1999 ◽  
Author(s):  
Randy J. Locke ◽  
Yolanda R. Hicks ◽  
Michelle M. Zaller ◽  
Robert C. Anderson
Keyword(s):  
High Pressure ◽  
Flow Field ◽  
Gas Turbine ◽  
Gas Turbine Combustor ◽  
Recent Advances ◽  
Combustion Flow ◽  
Field Imaging

Iterative filtered back projection image reconstruction for ultrasonic tomographic flow field imaging

2014 ◽  
Vol 22 (11) ◽  
pp. 3136-3144 ◽  
Author(s):  
柳建楠 LIU Jian-nan ◽  
王浩源 WANG Hao-yuan ◽  
王伯雄 WANG Bo-xiong ◽  
崔园园 CUI Yuan-yuan
Keyword(s):  
Image Reconstruction ◽  
Flow Field ◽  
Back Projection ◽  
Filtered Back Projection ◽  
Projection Image ◽  
Field Imaging

Flow Field Imaging for Quantitative Cycle Resolved Velocity Measurements in a Model Engine

1986 ◽  
Author(s):  
Kenneth A. Marko ◽  
Peter Li ◽  
Lajos Rimai ◽  
Tom Ma ◽  
Martin Davies
Keyword(s):  
Flow Field ◽  
Velocity Measurements ◽  
Model Engine ◽  
Field Imaging

Experiments in Bright-Field Imaging with Hollow-Cone Illumination

1981 ◽  
Vol 39 ◽  
pp. 226-227
Author(s):  
W. Kunath ◽  
K. Weiss ◽  
E. Zeitler
Keyword(s):  
Signal To Noise Ratio ◽  
Carbon Support ◽  
Electronic System ◽  
Optic Axis ◽  
Hollow Cone ◽  
Signal To Noise ◽  
Bright Field ◽  
Noise Ratio ◽  
Single Field ◽  
Field Imaging

Bright-field images taken with axial illumination show spurious high contrast patterns which obscure details smaller than 15 ° Hollow-cone illumination (HCI), however, reduces this disturbing granulation by statistical superposition and thus improves the signal-to-noise ratio. In this presentation we report on experiments aimed at selecting the proper amount of tilt and defocus for improvement of the signal-to-noise ratio by means of direct observation of the electron images on a TV monitor.Hollow-cone illumination is implemented in our microscope (single field condenser objective, Cs = .5 mm) by an electronic system which rotates the tilted beam about the optic axis. At low rates of revolution (one turn per second or so) a circular motion of the usual granulation in the image of a carbon support film can be observed on the TV monitor. The size of the granular structures and the radius of their orbits depend on both the conical tilt and defocus.

Detection of a point defect in a silicon single crystal by high-resolution TEM

1995 ◽  
Vol 53 ◽  
pp. 466-467
Author(s):  
M. Awaji
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Point Defect ◽  
Point Defects ◽  
Noise Level ◽  
Dark Field ◽  
Silicon Single Crystal ◽  
High Resolution Image ◽  
Dark Field Imaging ◽  
Field Imaging

It is necessary to improve the resolution, brightness and signal-to-noise ratio(s/n) for the detection and identification of point defects in crystals. In order to observe point defects, multi-beam dark-field imaging is one of the useful methods. Though this method can improve resolution and brightness compared with dark-field imaging by diffuse scattering, the problem of s/n still exists. In order to improve the exposure time due to the low intensity of the dark-field image and the low resolution, we discuss in this paper the bright-field high-resolution image and the corresponding subtracted image with reference to a changing noise level, and examine the possibility for in-situ observation, identification and detection of the movement of a point defect produced in the early stage of damage process by high energy electron bombardment.The high-resolution image contrast of a silicon single crystal in the [10] orientation containing a triple divacancy cluster is calculated using the Cowley-Moodie dynamical theory and for a changing gaussian noise level. This divacancy model was deduced from experimental results obtained by electron spin resonance. The calculation condition was for the lMeV Berkeley ARM operated at 800KeV.

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