Being able to detect, to identify and to quantify the severity of defects that appear within photovoltaic modules is essential to constitute a reliable, efficient and safety system, avoiding energy losses, mismatches and safety issues. The main objective of this paper is to perform an in-depth, onsite study of 17,142 monocrystalline modules to detect every single existing defect, classifying them in different groups, studying the variance of the same kind of defect in different modules and the patterns of each group of thermal defects. Results can be useful in a subsequent development of a software to automatically detect if a module has an anomaly and its classification. Focusing on the results obtained, all faults detected have been classified in five different thermographic defects modes: hotspot in a cell, bypass circuit overheated, hotspot in the junction box, hotspot in the connection of the busbar to the junction box and whole module overheated. An analysis of patterns of the different defects is included, studiyng location within the module, size and temperature statistical results, as average temperature, standard deviation, maximum temperature, median and first and third quartile.
Study on characterization of cured adhesive by ultraviolet for encapsulation photovoltaic modules
