Analysis of the structure of block copolymer films by atomic force microscopy

2009 ◽  
Vol 64 (2) ◽  
pp. 166-171
Author(s):  
E. A. Menshikov ◽  
A. V. Bol’shakova ◽  
I. V. Yaminskii
Keyword(s):  
Atomic Force Microscopy ◽  
Block Copolymer ◽  
Force Microscopy ◽  
Copolymer Films ◽  
Atomic Force

Direct Imaging of Interfacial Fluctuations in Confined Block Copolymer with in Situ Slow-Scan-Disabled Atomic Force Microscopy

ACS Nano ◽  
2019 ◽  
Vol 13 (10) ◽  
pp. 11741-11752 ◽  
Author(s):  
Jonathan G. Raybin ◽  
Julia G. Murphy ◽  
Moshe Dolejsi ◽  
S. J. Sibener
Keyword(s):  
Atomic Force Microscopy ◽  
Block Copolymer ◽  
Direct Imaging ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Synthesis and design of laboratory device from proton conducting block copolymer membrane

BIBECHANA ◽  
2012 ◽  
Vol 9 ◽  
pp. 50-58
Author(s):  
Shankar P Khatiwada ◽  
Amar P Yadav ◽  
Werner Lebek ◽  
Jean Marc Saiter ◽  
Rameshwar Adhikari
Keyword(s):  
Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Fourier Transform ◽  
Block Copolymer ◽  
Triblock Copolymer ◽  
Proton Conductance ◽  
Proton Conducting ◽  
Force Microscopy ◽  
Atomic Force ◽  
Laboratory Device

The butadiene units of polystyrene-block-polybutadiene-block-polystyrene (SBS) triblock copolymer were subjected to epoxidation and subsequent sulphonation in order to prepare proton conducting ionomer membrane. The products were characterized by different techniques such as atomic force microscopy, Fourier transform infrared (FTIR) spectroscopy and electron microscopy. A simple laboratory device was developed to carry out the tests on proton conductance ability of the prepared ionomer membrane. The experiments demonstrated that the prepared membrane excellently performed as proton conducting membrane. DOI: http://dx.doi.org/10.3126/bibechana.v9i0.7174 BIBECHANA 9 (2013) 50-58

In Situ Atomic Force Microscopy Imaging of Block Copolymer Micelles Adsorbed on a Solid Substrate

Langmuir ◽  
2003 ◽  
Vol 19 (24) ◽  
pp. 10449-10453 ◽  
Author(s):  
Simon D. Connell ◽  
Stephen Collins ◽  
Johan Fundin ◽  
Zhuo Yang ◽  
Ian W. Hamley
Keyword(s):  
Atomic Force Microscopy ◽  
Block Copolymer ◽  
Solid Substrate ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Block Copolymer Micelles ◽  
Copolymer Micelles

Nanostructured Thermoset Composites Containing Conductive TiO2 Nanoparticles

2012 ◽  
Vol 714 ◽  
pp. 147-152 ◽  
Author(s):  
Junkal Gutierrez ◽  
Agnieszka Tercjak ◽  
Iñaki Mondragon
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Properties ◽  
Block Copolymer ◽  
Electrostatic Force ◽  
Sol Gel ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Thermoset Composites ◽  
Atomic Force ◽  
Conductive Properties

Novel transparent multiphase nanostructured thermosetting composites with different block copolymer and sol-gel contents have been developed. Morphology of designed systems has been investigated by atomic force microscopy (AFM). Electrostatic force microscopy (EFM) has been used in order to study the conductive properties of prepared hybrid inorganic/organic nanostructured thermosetting systems. Moreover taking into account the optical properties of TiO2 nanoparticles UV-vis measurements indicate that TiO2 nanoparticles clearly enhance the UV-shielding efficiency of the inorganic/organic nanostructured thermosetting systems without losing high-visible light transparency.

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