Time-resolved X-ray reciprocal space mapping of the crystal under external electric field

2018 ◽  
Vol 189 (02) ◽  
pp. 187-194 ◽  
Author(s):  
Nikita V. Marchenkov ◽  
Anton G. Kulikov ◽  
Ivan I. Atknin ◽  
Arsen A. Petrenko ◽  
Alexander E. Blagov ◽  
...  
2019 ◽  
Vol 62 (2) ◽  
pp. 179-185 ◽  
Author(s):  
N V Marchenkov ◽  
A G Kulikov ◽  
I I Atknin ◽  
A A Petrenko ◽  
A E Blagov ◽  
...  

Author(s):  
I. A. Eliovich ◽  
V. I. Akkuratov ◽  
A. V. Targonskii ◽  
P. A. Prosekov ◽  
A. E. Blagov ◽  
...  

2005 ◽  
Vol 97 (10) ◽  
pp. 103904 ◽  
Author(s):  
Satoru Kaneko ◽  
Kensuke Akiyama ◽  
Yoshitada Shimizu ◽  
Hiroyasu Yuasa ◽  
Yasuo Hirabayashi ◽  
...  

1997 ◽  
Vol 71 (13) ◽  
pp. 1822-1824 ◽  
Author(s):  
M. Li ◽  
C. R. Becker ◽  
R. Gall ◽  
W. Faschinger ◽  
G. Landwehr

2021 ◽  
Vol 54 (5) ◽  
pp. 1317-1326
Author(s):  
Arsen Petrenko ◽  
Nataliya Novikova ◽  
Alexander Blagov ◽  
Anton Kulikov ◽  
Yury Pisarevskii ◽  
...  

The anisotropy of deformations in potassium acid phthalate crystals arising under the action of an external electric field up to 1 kV mm−1 applied along the [001] polar axis was studied using X-ray diffraction methods at room temperature. Electrical conductivity was measured and rocking curves for reflections 400, 070 and 004 were obtained by time-resolved X-ray diffractometry in Laue and Bragg geometries. Two saturation processes were observed from the time dependences of the electrical conductivity. A shift in the diffraction peaks and a change in their intensity were found, which indicated a deformation of the crystal structure. Rapid piezoelectric deformation and reversible relaxation-like deformation, kinetically similar to the electrical conductivity of a crystal, were revealed. The deformation depended on the polarity and strength of the applied field. The deformation was more noticeable in the [100] direction and was practically absent in the [001] direction of the applied field. X-ray diffraction analysis revealed a disordered arrangement of potassium atoms, i.e. additional positions and vacancies. The heights of potential barriers between the positions of K+ ions and the paths of their possible migration in the crystal structure of potassium acid phthalate were determined. The data obtained by time-resolved X-ray diffractometry and X-ray structure analysis, along with additional electrophysical measurements, allow the conclusion that the migration of charge carriers (potassium cations) leads to lateral deformation of the crystal structure of potassium phthalate in an external electric field.


2003 ◽  
Vol 798 ◽  
Author(s):  
K. Tachibana ◽  
Y. Harada ◽  
S. Saito ◽  
S. Nunoue ◽  
H. Katsuno ◽  
...  

ABSTRACTCharacterization by reciprocal space mapping of x-ray diffraction (XRD) intensity was carried out for epitaxial layers of GaN-based laser structures on two GaN substrates: GaN substrate and GaN template on sapphire substrate. The difference between these two substrates was shown clearly. The distribution of XRD intensity of the epitaxial layers on GaN substrate was smaller than that of the epitaxial layers on GaN template on sapphire substrate. In the lasers with the epitaxial structure on GaN substrate, the light output power was as high as 200 mW under continuous-wave operation at room temperature. Excellent noise characteristics with relative intensity noise of -132 dB/Hz were also obtained at a low light output power of 3 mW without any high-frequency modulation. These results support that GaN substrates are promising for realizing GaN-based lasers with high performance.


1996 ◽  
Vol 79 (7) ◽  
pp. 3578-3584 ◽  
Author(s):  
J. A. Olsen ◽  
E. L. Hu ◽  
S. R. Lee ◽  
I. J. Fritz ◽  
A. J. Howard ◽  
...  

1999 ◽  
Vol 32 (10A) ◽  
pp. A26-A31 ◽  
Author(s):  
H R Reß ◽  
T Gerhard ◽  
C Schumacher ◽  
V Hock ◽  
M Li ◽  
...  

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