scholarly journals Fabrication of Transmission-Line Transformer Using a Fine-grain Mn-Zn Ferrite.

2000 ◽  
Vol 24 (4−2) ◽  
pp. 883-886
Author(s):  
T. Inoue ◽  
T. Sato ◽  
K. Yamasawa ◽  
T. Takahashi ◽  
Y. Yamamoto ◽  
...  
1999 ◽  
Vol 35 (5) ◽  
pp. 3538-3540 ◽  
Author(s):  
T. Inoue ◽  
M. Furukawa ◽  
T. Sato ◽  
K. Yamasawa ◽  
T. Takahashi ◽  
...  

2002 ◽  
Vol 26 (4) ◽  
pp. 484-489 ◽  
Author(s):  
T. Kokai ◽  
T. Sato ◽  
K. Yamasawa ◽  
H. Karasawa ◽  
T. Sakuma

2003 ◽  
Vol 39 (5) ◽  
pp. 3205-3207 ◽  
Author(s):  
T. Sato ◽  
K. Sato ◽  
K. Yamasawa ◽  
Fuchun Zhang ◽  
K. Yanagisawa

2004 ◽  
Vol 28 (5) ◽  
pp. 731-737 ◽  
Author(s):  
K. Sato ◽  
T. Sato ◽  
K. Yamasawa ◽  
F. Zhang ◽  
K. Yanagisawa

Author(s):  
R. Sinclair ◽  
B.E. Jacobson

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).


Author(s):  
Harry Schaefer ◽  
Bruce Wetzel

High resolution 24mm X 36mm positive transparencies can be made from original black and white negatives produced by SEM, TEM, and photomicrography with ease, convenience, and little expense. The resulting 2in X 2in slides are superior to 3¼in X 4in lantern slides for storage, transport, and sturdiness, and projection equipment is more readily available. By mating a 35mm camera directly to an enlarger lens board (Fig. 1), one combines many advantages of both. The negative is positioned and illuminated with the enlarger and then focussed and photographed with the camera on a fine grain black and white film.Specifically, a Durst Laborator 138 S 5in by 7in enlarger with 240/200 condensers and a 500 watt Opale bulb (Ehrenreich Photo-Optical Industries, Inc., New York, NY) is rotated to the horizontal and adjusted for comfortable eye level viewing.


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