scholarly journals Measurement and ab initio Investigation of Structural, Electronic, Optical, and Mechanical Properties of Sputtered Aluminum Nitride Thin Films

2020 ◽  
Vol 8 ◽  
Author(s):  
A. M. Alsaad ◽  
Qais M. Al-Bataineh ◽  
I. A. Qattan ◽  
Ahmad A. Ahmad ◽  
A. Ababneh ◽  
...  
2019 ◽  
Vol 293 ◽  
pp. 128-135 ◽  
Author(s):  
P. Schmid ◽  
F. Triendl ◽  
C. Zarfl ◽  
S. Schwarz ◽  
W. Artner ◽  
...  

1988 ◽  
Vol 129 ◽  
Author(s):  
F. L. Williams ◽  
L. L. Boyer ◽  
W. Reicher ◽  
J. J. McNally ◽  
G. A. Al-Jumaily ◽  
...  

ABSTRACTWe have deposited thin films of optical materials using ion beam sputtering and ion assisted deposition techniques. It is possible to obtain good quality film material deposited on substrates at temperatures lower than normally required. Ion assisted deposition influences film stoichiometry and packing density, which in turn determine optical and mechanical properties of the film material. We discuss two general indicators which appear helpful in predicting the degree to which these occur.


2014 ◽  
Vol 568 ◽  
pp. 19-24 ◽  
Author(s):  
Priyanka Nayar ◽  
Atul Khanna ◽  
D. Kabiraj ◽  
S.R. Abhilash ◽  
Ben D. Beake ◽  
...  

2009 ◽  
Vol 55 (5(1)) ◽  
pp. 1780-1784
Author(s):  
Sang-Jin Cho ◽  
In-Seob Bae ◽  
Jin-Hyo Boo ◽  
Sungwoo Lee ◽  
Donggeun Jung

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